31.140 - Piezoelectric devices
ICS 31.140 Details
Piezoelectric devices
Piezoelektrische Bauelemente
Dispositifs piezo-electriques
Piezoelektrične naprave
General Information
Frequently Asked Questions
ICS 31.140 is a classification code in the International Classification for Standards (ICS) system. It covers "Piezoelectric devices". The ICS is a hierarchical classification system used to organize international, regional, and national standards, facilitating the search and identification of standards across different fields.
There are 363 standards classified under ICS 31.140 (Piezoelectric devices). These standards are published by international and regional standardization bodies including ISO, IEC, CEN, CENELEC, and ETSI.
The International Classification for Standards (ICS) is a hierarchical classification system maintained by ISO to organize standards and related documents. It uses a three-level structure with field (2 digits), group (3 digits), and sub-group (2 digits) codes. The ICS helps users find standards by subject area and enables statistical analysis of standards development activities.
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- Corrigendum3 pagesEnglish languagee-Library read for1 day
IEC 63041-3:2026 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors. Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.
This edition includes the following significant technical changes with respect to the previous edition:
a) Some terms in Clause 3 have been updated to be consistent with IEC TS 61994-5:2023.
- Standard16 pagesEnglish languagee-Library read for1 day
IEC 60444-11:2026 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
This edition includes the following significant technical changes with respect to the previous edition:
a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A;
b) some formulae in the first edition have been corrected.
- Standard27 pagesEnglish languagesale 15% off
- Standard56 pagesEnglish languagesale 15% off
- Standard27 pagesFrench languagesale 15% off
IEC 63041-3:2026 is available as IEC 63041-3:2026 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 63041-3:2026 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors. Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle. This edition includes the following significant technical changes with respect to the previous edition: a) Some terms in Clause 3 have been updated to be consistent with IEC TS 61994-5:2023.
- Standard16 pagesEnglish languagee-Library read for1 day
- Corrigendum3 pagesEnglish languagee-Library read for1 day
IEC 60862-1:2015 specifies the methods of test and general requirements for SAW filters of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition:
- the terms and definitions from IEC 60862-2:2002 are included;
- the measurement method for the balanced type filter is described;
- the electrostatic discharge (ESD) sensitivity test procedure is considered.
- Standard2 pagesEnglish and French languagesale 15% off
IEC 63541:2025 applies to lithium tantalate (LT) and lithium niobate (LN) crystals for surface acoustic wave devices, including the as-grown crystals and lumbered crystals.
- Standard28 pagesEnglish languagee-Library read for1 day
IEC 63041-3:2026 is available as IEC 63041-3:2026 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 63041-3:2026 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors. Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.
This edition includes the following significant technical changes with respect to the previous edition:
a) Some terms in Clause 3 have been updated to be consistent with IEC TS 61994-5:2023.
- Standard12 pagesEnglish languagesale 15% off
- Standard37 pagesEnglish languagesale 15% off
- Standard12 pagesFrench languagesale 15% off
- Standard24 pagesEnglish and French languagesale 15% off
IEC 63541:2025 applies to lithium tantalate (LT) and lithium niobate (LN) crystals for surface acoustic wave devices, including the as-grown crystals and lumbered crystals.
- Standard28 pagesEnglish languagee-Library read for1 day
IEC 63541:2025 applies to lithium tantalate (LT) and lithium niobate (LN) crystals for surface acoustic wave devices, including the as-grown crystals and lumbered crystals.
- Standard25 pagesEnglish languagesale 15% off
- Standard25 pagesFrench languagesale 15% off
- Standard50 pagesEnglish and French languagesale 15% off
IEC 60122-2:2025 has been compiled in response to a generally expressed desire on the part of both users and manufacturers for guidelines to the use of quartz crystal units for filters and oscillators so that the crystal units may be used to their best advantage.
It draws attention to some of the more fundamental questions which will be considered by the user before it places its order for a unit for a new application, and in so doing will, it is hoped, help ensure against unsatisfactory performance, unfavourable cost and non-availability. It is not the function of this document to explain theory, nor to attempt to cover all the eventualities that can arise in practical circumstances. Lastly, it it is not considered as a substitute for close liaison between manufacturer and user.
Standard specifications, such as those of the IEC of which these guidelines form a part, and national specifications or detail specifications issued by manufacturers, will define the available combinations of the resonant characteristics and the temperature characteristic. These specifications are compiled to include a wide range of quartz crystal units with standardized performances. It cannot be over-emphasized that it is the responsibility of the user , wherever possible, to select the quartz crystal units from these specifications, when available, even if it can lead to making small modifications to the circuit to enable the use of standard resonators. This applies particularly to the selection of the nominal frequency.
This edition includes the following significant technical changes with respect to the previous edition:
a) addition of SC cut type and related requirements;
b) addition of ageing calculation and low level of drive requirements according to the general specification,
c) update of the frequency temperature curve according to the common cut requirements;
d) removal of infrequently used product types.
- Standard40 pagesEnglish languagee-Library read for1 day
IEC 60122-2:2025 has been compiled in response to a generally expressed desire on the part of both users and manufacturers for guidelines to the use of quartz crystal units for filters and oscillators so that the crystal units may be used to their best advantage. It draws attention to some of the more fundamental questions which will be considered by the user before it places its order for a unit for a new application, and in so doing will, it is hoped, help ensure against unsatisfactory performance, unfavourable cost and non-availability. It is not the function of this document to explain theory, nor to attempt to cover all the eventualities that can arise in practical circumstances. Lastly, it it is not considered as a substitute for close liaison between manufacturer and user. Standard specifications, such as those of the IEC of which these guidelines form a part, and national specifications or detail specifications issued by manufacturers, will define the available combinations of the resonant characteristics and the temperature characteristic. These specifications are compiled to include a wide range of quartz crystal units with standardized performances. It cannot be over-emphasized that it is the responsibility of the user , wherever possible, to select the quartz crystal units from these specifications, when available, even if it can lead to making small modifications to the circuit to enable the use of standard resonators. This applies particularly to the selection of the nominal frequency. This edition includes the following significant technical changes with respect to the previous edition: a) addition of SC cut type and related requirements; b) addition of ageing calculation and low level of drive requirements according to the general specification, c) update of the frequency temperature curve according to the common cut requirements; d) removal of infrequently used product types.
- Standard40 pagesEnglish languagee-Library read for1 day
IEC 60122-2:2025 has been compiled in response to a generally expressed desire on the part of both users and manufacturers for guidelines to the use of quartz crystal units for filters and oscillators so that the crystal units may be used to their best advantage.
It draws attention to some of the more fundamental questions which will be considered by the user before it places its order for a unit for a new application, and in so doing will, it is hoped, help ensure against unsatisfactory performance, unfavourable cost and non-availability. It is not the function of this document to explain theory, nor to attempt to cover all the eventualities that can arise in practical circumstances. Lastly, it it is not considered as a substitute for close liaison between manufacturer and user.
Standard specifications, such as those of the IEC of which these guidelines form a part, and national specifications or detail specifications issued by manufacturers, will define the available combinations of the resonant characteristics and the temperature characteristic. These specifications are compiled to include a wide range of quartz crystal units with standardized performances. It cannot be over-emphasized that it is the responsibility of the user , wherever possible, to select the quartz crystal units from these specifications, when available, even if it can lead to making small modifications to the circuit to enable the use of standard resonators. This applies particularly to the selection of the nominal frequency.
This edition includes the following significant technical changes with respect to the previous edition:
a) addition of SC cut type and related requirements;
b) addition of ageing calculation and low level of drive requirements according to the general specification,
c) update of the frequency temperature curve according to the common cut requirements;
d) removal of infrequently used product types.
- Standard73 pagesEnglish and French languagesale 15% off
IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
This edition includes the following significant technical changes with respect to the previous edition:
a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development;
b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3;
c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers;
d) The tolerance of Curie temperature specification for LN and LT have been added in order to meet the development requirements of the industry;
e) Measurement of thickness, TV5, TTV, LTV and PLTV have been completed, including measurement principle and method of thickness, TV5, TTV, LTV and PLTV.
- Standard44 pagesEnglish languagee-Library read for1 day
IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development; b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3; c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers; d) The tolerance of Curie temperature specification for LN and LT have been added in order to meet the development requirements of the industry; e) Measurement of thickness, TV5, TTV, LTV and PLTV have been completed, including measurement principle and method of thickness, TV5, TTV, LTV and PLTV.
- Standard44 pagesEnglish languagee-Library read for1 day
IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
This edition includes the following significant technical changes with respect to the previous edition:
a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development;
b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3;
c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers;
d) The tolerance of Curie temperature specification for LN and LT have been added in order to meet the development requirements of the industry;
e) Measurement of thickness, TV5, TTV, LTV and PLTV have been completed, including measurement principle and method of thickness, TV5, TTV, LTV and PLTV.
- Standard82 pagesEnglish and French languagesale 15% off
IEC TS 61994-5:2023 gives the terms and definitions for sensors representing the state of the art, which are intended for manufacturing piezoelectric elements, cells, modules and the systems. This edition includes the following significant technical changes with respect to the previous edition: New terms and definitions have been added from IEC 63041-1:2021 and IEC 63041-3:2020.
- Technical specification11 pagesEnglish languagesale 15% off
- Technical specification22 pagesEnglish languagesale 15% off
IEC 62604-2:2022 is available as IEC 62604-2:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition:
- the term "cross-isolation" has been added to Clause 3;
- multiplexers are described.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.
- Standard29 pagesEnglish languagee-Library read for1 day
IEC 62604-2:2022 is available as IEC 62604-2:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition: - the term "cross-isolation" has been added to Clause 3; - multiplexers are described. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.
- Standard29 pagesEnglish languagee-Library read for1 day
IEC 62604-1:2022 is available as IEC 62604-1:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition:
- the term "multiplexer" has been added to Clause 3.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.
- Standard37 pagesEnglish languagee-Library read for1 day
IEC 62604-1:2022 is available as IEC 62604-1:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition: - the term "multiplexer" has been added to Clause 3. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.
- Standard37 pagesEnglish languagee-Library read for1 day
IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition:
- the term "cross-isolation" has been added to Clause 3;
- multiplexers are described.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.
- Standard83 pagesEnglish languagesale 15% off
- Standard53 pagesEnglish and French languagesale 15% off
IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition:
- the term "multiplexer" has been added to Clause 3.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.
- Standard97 pagesEnglish languagesale 15% off
- Standard64 pagesEnglish and French languagesale 15% off
IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.
- Standard23 pagesEnglish languagee-Library read for1 day
This part of IEC 60122 is applicable to crystal units with thermistors mainly used in the field of mobile communication that requires high frequency stability such as local reference signal generator for the mobile phone base station or GPS. This document provides users with technical guidelines of crystal units with thermistors as well as basic knowledge of common crystal units with thermistors.
- Standard17 pagesEnglish languagee-Library read for1 day
This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc.
The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly.
- Standard33 pagesEnglish languagee-Library read for1 day
This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly.
- Standard33 pagesEnglish languagee-Library read for1 day
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).
- Standard23 pagesEnglish languagee-Library read for1 day
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).
- Standard23 pagesEnglish languagee-Library read for1 day
IEC 63041-1:2021 applies to piezoelectric sensors of resonator, delay-line and non-acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly. This edition includes the following significant technical changes with respect to the previous edition:
- the new terms "piezoelectric sensor system" and "wireless SAW sensor system" and their definitions have been added;
- new types of sensor modules and sensor system have been added;
- some symbols of sensor elements are added in Clause 4;
- a new Figure B.3 has been added in Annex B;
- Annex C has been added.
- Standard90 pagesEnglish languagesale 15% off
- Standard60 pagesEnglish and French languagesale 15% off
IEC 60444-6:2021 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based on the p-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the p-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture). This edition includes the following significant technical changes with respect to the previous edition:
- some equations have been removed and corrected;
- it has been specified in the note of the Scope that the measurement methods specified in this document are not only applicable to AT-cut but also to other crystal cuts and vibration modes.
- Standard63 pagesEnglish languagesale 15% off
- Standard41 pagesEnglish and French languagesale 15% off
- Standard33 pagesEnglish and French languagesale 15% off
- Standard33 pagesEnglish and French languagesale 15% off
IEC 61837-2:2018(E) deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016. This edition includes the following significant technical changes with respect to the previous edition: a. revision of the figures to match the notation of the drawings of IEC 61240:2016; b. addition of 7 enclosures as follows: DCC-6/5032A, DCC-6/3225A, DCC-4/3215C, DCC-6/2016A, DCC-2/2012C, DCC-2/1610C, DCC-4/1210C. As a result, this third edition contains a total of 45 enclosure types, which are listed in Table 1.
- Standard102 pagesEnglish languagee-Library read for1 day
IEC 62884-3:2018(E) describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions. This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.
- Standard16 pagesEnglish languagee-Library read for1 day
IEC TS 61994-3:2021(E) gives the terms and definitions for piezoelectric, dielectric and electrostatic oscillators representing the state of the art, which are intended for use in the standards and documents of IEC TC 49.
The main changes with respect to the previous edition are as listed below:
- some definitions have been updated;
- the terminology given in IEC 60679-1:2017 has been taken into account;
- new terminologies are added.
- Technical specification19 pagesEnglish languagesale 15% off
IEC 63041-2:2017(E) is applicable to piezoelectric chemical sensors mainly used in the field of biological, medical, gas and environmental sciences. It provides users with technical guidelines on biochemical sensors as well as basic knowledge of common chemical sensors.
- Standard19 pagesEnglish languagee-Library read for1 day
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IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors.
Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.
- Standard16 pagesEnglish languagee-Library read for1 day
IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
- Standard27 pagesEnglish languagee-Library read for1 day
IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors. Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.
- Standard16 pagesEnglish languagee-Library read for1 day
- Standard24 pagesEnglish languagesale 15% off
- Standard48 pagesEnglish and French languagesale 15% off
IEC 61837-2:2018 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016.
This edition includes the following significant technical changes with respect to the previous edition:
a. revision of the figures to match the notation of the drawings of IEC 61240:2016;
b. addition of 7 enclosures as follows: DCC-6/5032A, DCC-6/3225A, DCC-4/3215C, DCC-6/2016A, DCC-2/2012C, DCC-2/1610C, DCC-4/1210C.
As a result, this third edition contains a total of 45 enclosure types, which are listed in Table 1.
- Standard99 pagesEnglish languagesale 15% off
- Standard240 pagesEnglish languagesale 15% off
- Standard198 pagesEnglish and French languagesale 15% off
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IEC 60679-1:2017(E) specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures. NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration. This edition includes the following significant technical changes with respect to the previous edition: a) the title has been changed; b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included; c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series); d) the content of Annex A has been extended; e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added; f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added; g) Annex D has been added.
- Standard39 pagesEnglish languagee-Library read for1 day
IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors.
Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.
- Standard25 pagesEnglish and French languagesale 15% off
IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology.
This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability.
It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.
- Standard23 pagesEnglish languagee-Library read for1 day
IEC 62884-1:2017(E) specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator")
- Standard65 pagesEnglish languagee-Library read for1 day
IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology. This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability. It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.
- Standard23 pagesEnglish languagee-Library read for1 day