SIST EN ISO 12179:2022

SLOVENSKI STANDARD
01-marec-2022
Nadomešča:
SIST EN ISO 12179:2000
SIST EN ISO 12179:2000/AC:2008
Specifikacija geometrijskih veličin izdelka (GPS) - Tekstura površine: profilna
metoda - Umerjanje kontaktnih (s tipalom) instrumentov (ISO 12179:2021)
Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration
of contact (stylus) instruments (ISO 12179:2021)
Geometrische Produktspezifikation (GPS) - Oberflächenbeschaffenheit:
Tastschnittverfahren - Kalibrierung von Tastschnittgeräten (ISO 12179:2021)
Spécification géométrique des produits (GPS) - Etats de surface : Méthode du profil -
Etalonnage des instruments à contact (palpeur) (ISO 12179:2021)
Ta slovenski standard je istoveten z: EN ISO 12179:2022
ICS:
17.040.30 Merila Measuring instruments
17.040.40 Specifikacija geometrijskih Geometrical Product
veličin izdelka (GPS) Specification (GPS)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EN ISO 12179
EUROPEAN STANDARD
NORME EUROPÉENNE
January 2022
EUROPÄISCHE NORM
ICS 17.040.30 Supersedes EN ISO 12179:2000, EN ISO
12179:2000/AC:2008
English Version
Geometrical product specifications (GPS) - Surface texture:
Profile method - Calibration of contact (stylus)
instruments (ISO 12179:2021)
Spécification géométrique des produits (GPS) - Etats de Geometrische Produktspezifikation (GPS) -
surface : Méthode du profil - Etalonnage des Oberflächenbeschaffenheit: Tastschnittverfahren -
instruments à contact (palpeur) (ISO 12179:2021) Kalibrierung von Tastschnittgeräten (ISO 12179:2021)
This European Standard was approved by CEN on 27 November 2021.

CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this
European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references
concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN
member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by
translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management
Centre has the same status as the official versions.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and
United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2022 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 12179:2022 E
worldwide for CEN national Members.

Contents Page
European foreword . 3

European foreword
This document (EN ISO 12179:2022) has been prepared by Technical Committee ISO/TC 213
"Dimensional and geometrical product specifications and verification" in collaboration with Technical
Committee CEN/TC 290 “Dimensional and geometrical product specification and verification” the
secretariat of which is held by AFNOR.
This European Standard shall be given the status of a national standard, either by publication of an
identical text or by endorsement, at the latest by July 2022, and conflicting national standards shall be
withdrawn at the latest by July 2022.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes EN ISO 12179:2000.
Any feedback and questions on this document should be directed to the users’ national standards
body/national committee. A complete listing of these bodies can be found on the CEN website.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the
United Kingdom.
Endorsement notice
The text of ISO 12179:2021 has been approved by CEN as EN ISO 12179:2022 without any modification.

INTERNATIONAL ISO
STANDARD 12179
Second edition
2021-12
Geometrical product specifications
(GPS) — Surface texture: Profile
method — Calibration of contact
(stylus) instruments
Spécification géométrique des produits (GPS) — État de surface:
Méthode du profil — Étalonnage des instruments à contact (palpeur)
Reference number
ISO 12179:2021(E)
ISO 12179:2021(E)
© ISO 2021
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii
ISO 12179:2021(E)
Contents Page
Foreword .v
Introduction . vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Conditions of use .3
4.1 Components and configurations of the contact (stylus) instrument . 3
4.2 Calibration of a configuration . 3
4.3 Place of calibration . 3
4.4 Defects . 3
5 Measurement standards . .3
6 Contact (stylus) instrument metrological characteristics . 6
6.1 General . 6
6.2 Residual profile calibration . 6
6.3 Vertical profile component calibration . 6
6.4 Horizontal profile component calibration . 6
6.5 Profile coordinate system calibration . 6
6.6 Total contact (stylus) instrument calibration . 6
7 Calibration .7
7.1 Preparation for calibration . 7
7.2 E valuation of the residual profile . 7
7.3 Calibration of the vertical profile component . 7
7.3.1 Overall objective . 7
7.3.2 Procedure . 7
7.4 Calibration of the horizontal profile component . . 8
7.4.1 Overall objective . 8
7.4.2 Procedure . 8
7.5 Calibration of the profile coordinate system . 8
7.5.1 Overall objective . 8
7.5.2 Procedure . 8
7.6 Calibration of the total contact (stylus) instrument . 8
7.6.1 Overall objective . 8
7.6.2 Procedure . 9
7.7 Other calibrations . 9
8 Measurement uncertainty .9
8.1 Information from the calibration certificate for a measurement standard . 9
8.2 The uncertainty of the values measured during calibration of a measuring
instrument using a measurement standard. 9
9 Contact (stylus) instrument calibration certificate .10
10 General information .10
Annex A (normative) Calibration of instruments measuring parameters of the motifs
method .11
Annex B (normative) Calibration of simplified operator instruments for the measurements
of surface texture .13
Annex C (informative) Example: roughness measurement standard parameter Ra .14
Annex D (informative) Concept diagram .17
Annex E (informative) Overview of profile and areal standards in the GPS matrix model .18
iii
ISO 12179:2021(E)
Annex F (informative) Relation to the GPS matrix model .19
Bibliography .20
iv
ISO 12179:2021(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to
the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 213, Dimensional and geometrical product
specifications and verification, in collaboration with the European Committee for Standardization (CEN)
Technical Committee CEN/TC 290, Dimensional and geometrical product specification and verification, in
accordance with the Agreement on technical cooperation between ISO and CEN (Vienna Agreement).
This second edition cancels and replaces the first edition (ISO 12179:2000), which has been technically
revised. It also incorporates Technical Corrigendum ISO 12179:2000/Cor. 1:2003.
The main changes to the previous edition are as follows:
— Annex C has been amended.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
v
ISO 12179:2021(E)
Introduction
This document is a geometrical product specification (GPS) standard and is to be regarded as a general
GPS standard (see ISO 14638). It influences chain link G of the chain of standards on profile surface
texture.
The ISO GPS matrix model is given in ISO 14638, For more detailed information on the relationship of
this document to the GPS matrix model, see Annex F. An overview of standards on profiles and areal
surface texture is given in Annex E.
This document introduces calibration of contact (stylus) instruments as defined in ISO 3274. The
calibration is carried out with the aid of measurement standards.
vi
INTERNATIONAL STANDARD ISO 12179:2021(E)
Geometrical product specifications (GPS) — Surface
texture: Profile method — Calibration of contact (stylus)
instruments
1 Scope
This document specifies the calibration and adjustment of the metrological characteristics of contact
(stylus) instruments for the measurement of surface texture by the profile method as defined in
ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement
standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator
contact (stylus) instruments which do not conform with ISO 3274.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 3274, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal
characteristics of contact (stylus) instruments
ISO 5436-1:2000, Geometrical Product Specifications (GPS) — Surface texture: Profile method;
Measurement standards — Part 1: Material measures
ISO 10012, Measurement management systems — Requirements for measurement processes and measuring
equipment
ISO 14253-1, Geometrical product specifications (GPS) — Inspection by measurement of workpieces and
measuring equipment — Part 1: Decision rules for verifying conformity or nonconformity with specifications
ISO 14253-2, Geometrical product specifications (GPS) — Inspection by measurement of workpieces
and measuring equipment — Part 2: Guidance for the estimation of uncertainty in GPS measurement, in
calibration of measuring equipment and in product verification
ISO 21920-2, Geometrical product specifications (GPS) — Surface texture: Profile — Part 2: Terms,
definitions and surface texture parameters
ISO 25178-73, Geometrical product specifications (GPS) — Surface texture: Areal — Part 73: Terms and
definitions for surface defects on material measures
ISO/IEC Guide 98-3, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in
measurement (GUM: 1995)
ISO/IEC Guide 99, International vocabulary of metrology — Basic and general concepts and associated
terms (VIM)
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 3274, ISO 14253-1, ISO 21920-2,
GUM and VIM and the following apply.
ISO 12179:2021(E)
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1
calibration
operation that, under specified conditions:
a) in a first step, establishes a relation between the quantity values with measurement uncertainties
provided by measurement standards and corresponding indications with associated measurement
uncertainties; and
b) in a second step, uses this information to establish a relation for obtaining a measurement result
from an indication
[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.39, modified — Notes to entry removed.]
3.2
task-related calibration
set of operations which establish, under specified conditions, the relationship between values of
quantities indicated by a measuring instrument and the corresponding known values of a limited
family of precisely defined measurands which constitute a subset of the measuring capabilities of the
measuring instrument
3.3
adjustment
adjustment of a measuring system
set of operations carried out on a measuring system so that it provides prescribed indications
corresponding to given values of a quantity to be measured
[SOURCE: ISO/IEC Guide 99:2007 (VIM), 3.11, modified — Notes to entry removed.]
3.4
measurement standard
etalon
realization of the definition of a given quantity, with stated quantity value and associated measurement
uncertainty, used as a reference
Note 1 to entry: Measurement standards are also referred to as “calibration specimens”.
[SOURCE: ISO/IEC Guide 99:2007 (VIM), 5.1, modified — Examples and Notes to entry removed.]
3.5
measurement uncertainty
uncertainty of measurement
uncertainty
non-negative parameter characterizing the dispersion of the quantity values being attributed to a
measurand, based on the information used
[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.26, modified — Notes to entry removed.]
3.6
metrological traceability
property of a measurement result whereby the result can be related to a reference through a
documented unbroken chain of calibrations, each contributing to the measurement uncertainty
[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.41, modified — Notes to entry removed.]
ISO 12179:2021(E)
3.7
defect
part of the measurement standard’s geometrical feature (non-ideal surface) on
which the geometrical shape and geometrical dimensions deviate from those on the nominal feature
(ideal surface) either by an amount greater than some agreed or stated maximum value, or, in the
absence of any such agreed or stated maximum value, by an amount greater than what is typical or
characteristic for the processes used in manufacturing the measurement standard
[SOURCE: ISO 25178-73:2019, 3.1.2, modified — Notes to entry removed.]
4 Conditions of use
4.1 Components and configurations of the contact (stylus) instrument
The contact (stylus) instrument comprises the basic equipment, a drive unit, a probe and a profile
recorder (see ISO 3274). If the basic equipment is used with several drive units and probes, each of
these instrumental combinations (configurations) shall be calibrated separately.
4.2 Calibration of a configuration
The contact (stylus) instrument shall be calibrated when a change is made to the basic elements of the
system which intentionally or unintentionally modifies the measured profile or measuring result. Each
configuration of the contact (stylus) instrument shall be calibrated separately. For example, with a
change of probe, the contact (stylus) instrument is calibrated.
4.3 Place of calibration
The contact (stylus) instrument should be calibrated at the place of use with environmental conditions
similar to those present when in use for measurement to take into account external influence factors.
EXAMPLES Noise, temperature, vibration, air movement.
4.4 Defects
Geometrical defects that can be present on the surfaces of material measures and calibration specimens
shall be taken into consideration according to ISO 25178-73.
5 Measurement standards
The following measurement standards are applicable to the calibrations given in Clause 6:
— optical flat;
— depth measurement standard (see Figure 1): type A according to ISO 5436-1:2000;
— spacing measurement standard (see Figure 2): type C according to ISO 5436-1:2000;
— inclined optical flat (see Figure 3);
— profile coordinate measurement standard (consisting of a sphere or prism): type E according to
ISO 5436-1:2000;
— roughness measurement standard (see Figure 4): type D according to ISO 5436-1:2000.
It is recommended that a profile coordinate measurement standard be used on contact (stylus)
instruments where the stylus rotates at least plus and minus one half of a degree when moving through
its full range.
NOTE A type C periodic measurement stan
...