EN 60384-1:2016

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Nespremenljivi kondenzatorji za elektronsko opremo - 1. del: Rodovna specifikacija (IEC 60384-1:2016)Condensateurs fixes utilisés dans les équipements électroniques - Partie 1: Spécification générique (IEC 60384-1:2016)Fixed capacitors for use in electronic equipment - Part 1: Generic specification (IEC 60384-1:2016)31.060.10Fiksni kondenzatorjiFixed capacitorsICS:Ta slovenski standard je istoveten z:EN 60384-1:2016SIST EN 60384-1:2016en01-december-2016SIST EN 60384-1:2016SLOVENSKI
STANDARDSIST EN 60384-1:20101DGRPHãþD

EUROPEAN STANDARD NORME EUROPÉENNE EUROPÄISCHE NORM
EN 60384-1
September 2016 ICS 31.060
Supersedes
EN 60384-1:2009
English Version
Fixed capacitors for use in electronic equipment - Part 1: Generic specification (IEC 60384-1:2016)
Condensateurs fixes utilisés dans les équipements électroniques - Partie 1: Spécification générique (IEC 60384-1:2016)
Festkondensatoren zur Verwendung in Geräten der Elektronik - Teil 1: Fachgrundspezifikation (IEC 60384-1:2016) This European Standard was approved by CENELEC on 2016-03-18. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17,
B-1000 Brussels © 2016 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60384-1:2016 E SIST EN 60384-1:2016

This document supersedes EN 60384-1:2009. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 60384-1:2016 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60384-2 NOTE Harmonized as EN 60384-2. IEC 60384-3 NOTE Harmonized as EN 60384-3. IEC 60384-3-1 NOTE Harmonized as EN 60384-3-1. IEC 60384-26 NOTE Harmonized as EN 60384-26. IEC 60469:2013 NOTE Harmonized as EN 60469:2013. ISO 9000 NOTE Harmonized as EN ISO 9000.
Annex ZA (normative)
Normative references to international publications with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu.
Publication Year Title EN/HD Year IEC 60027 series
Letter symbols to be used in electrical technology EN 60027 series
IEC 60050 series
International Electrotechnical Vocabulary - series
IEC 60062 -
Marking codes for resistors and capacitors EN 60062 -
IEC 60063 -
Preferred number series for resistors and capacitors EN 60063 -
IEC 60068-1 2013
Environmental testing -- Part 1: General and guidance EN 60068-1 2014
IEC 60068-2-1 2007
Environmental testing -- Part 2-1: Tests - Test A: Cold EN 60068-2-1 2007
IEC 60068-2-2 2007
Environmental testing -- Part 2-2: Tests - Test B: Dry heat EN 60068-2-2 2007
IEC 60068-2-6 2007
Environmental testing -- Part 2-6: Tests - Test Fc: Vibration (sinusoidal) EN 60068-2-6 2008
IEC 60068-2-13 1983
Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure EN 60068-2-13 1999
IEC 60068-2-14 2009
Environmental testing -- Part 2-14: Tests - Test N: Change of temperature EN 60068-2-14 2009
IEC 60068-2-17 1994
Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing EN 60068-2-17 1994
IEC 60068-2-20 2008
Environmental testing -- Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads EN 60068-2-20 2008
IEC 60068-2-21 2006
Environmental testing -- Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices EN 60068-2-21 2006
IEC 60068-2-27 2008
Environmental testing -- Part 2-27: Tests - Test Ea and guidance: Shock EN 60068-2-27 2009
IEC 60068-2-30 2005
Environmental testing -- Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) EN 60068-2-30 2005
IEC 60068-2-45 AMD 1 1993
Basic environmental testing procedures; part_2: tests; test_XA and guidance: immersion in cleaning solvents; amendment_1 - -
IEC 60068-2-45 1980
Basic environmental testing procedures - Part 2-45: Tests - Test XA and guidance: Immersion in cleaning solvents EN 60068-2-45 1992
Environmental testing - Part 2-54: Tests - Test Ta: Solderability testing
of electronic components by the wetting balance method EN 60068-2-54 2006
IEC 60068-2-58 2015
Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) EN 60068-2-58 2015
IEC 60068-2-67 1995
Environmental testing -- Part 2: Tests - Test Cy: Damp heat, steady state, accelerated test primarily intended for components EN 60068-2-67 1996
IEC 60068-2-69 2007
Environmental testing - Part 2: Tests - Test Te: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method EN 60068-2-69 2007
IEC 60068-2-78 2012
Environmental testing -- Part 2-78: Tests - Test Cab: Damp heat, steady state EN 60068-2-78 2013
IEC 60068-2-82 2007
Environmental testing -- Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components EN 60068-2-82 2007
IEC 60294 -
Measurement of the dimensions of a cylindrical component with axial terminations EN 60294 -
IEC 60617 -
Standard data element types with associated classification scheme for electric components -- Part 4: IEC reference collection for standard data element types and component classes - -
IEC 60695-11-5 2004
Fire hazard testing -- Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance EN 60695-11-5 2005
IEC 60717 -
Method for the determination of the space required by capacitors and resistors with unidirectional terminations EN 60717 -
IEC 61193-2 -
Quality assessment systems -- Part 2: Selection and use of sampling plans for inspection of electronic components and packages EN 61193-2 -
IEC 61249-2-7 2002
Materials for printed boards and other interconnecting structures -- Part 2-7: Reinforced base materials, clad and unclad - Epoxide woven E-glass laminated sheet of defined flammability (vertical burning test), copper-clad EN 61249-2-7 2002
- -
+ corrigendum Sep. 2005
ISO 3 -
Preferred numbers; Series of preferred numbers - -
ISO 80000-1 -
Quantities and units -- Part 1: General EN ISO 80000-1 -
IEC 60384-1 Edition 5.0 2016-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Fixed capacitors for use in electronic equipment –
Part 1: Generic specification
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 1: Spécification générique
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE
ICS 31.060
ISBN 978-2-8322-3153-1
– 2 – IEC 60384-1:2016  IEC 2016 CONTENTS FOREWORD . 9 INTRODUCTION . 11 1 General . 13 1.1 Scope . 13 1.2 Normative references . 13 2 Technical data . 15 2.1 Symbols, units and abbreviated terms . 15 2.1.1 General . 15 2.1.2 Letter symbols . 15 2.1.3 Abbreviations . 16 2.2 Terms and definitions . 16 2.3 Preferred values and additional technical requirements . 21 2.3.1 General . 21 2.3.2 Preferred values of nominal capacitance . 21 2.3.3 Preferred values of rated voltage . 21 2.3.4 Rated a.c. load . 21 2.3.5 Rated pulse load . 22 2.3.6 Temperature derated voltage . 22 2.4 Marking . 23 2.4.1 General . 23 2.4.2 Coding . 23 3 Quality assessment procedures . 23 4 Tests and measurement procedures . 24 4.1 General . 25 4.2 Standard atmospheric conditions . 25 4.2.1 Standard atmospheric conditions for testing . 25 4.2.2 Recovery conditions . 25 4.2.3 Referee conditions . 26 4.2.4 Reference conditions . 26 4.3 Drying . 26 4.4 Visual examination and check of dimensions . 26 4.4.1 Visual examination . 26 4.4.2 Dimensions (gauging) . 26 4.4.3 Dimensions (detail) . 26 4.5 Insulation resistance . 27 4.5.1 Preconditioning . 27 4.5.2 Measuring conditions . 27 4.5.3 Test points . 27 4.5.4 Test methods . 27 4.5.5 Temperature compensation . 28 4.5.6 Conditions to be prescribed in the relevant specification . 28 4.6 Voltage proof . 29 4.6.1 General . 29 4.6.2 Test circuit (for the test between terminations) . 29 4.6.3 Test . 30 4.6.4 Requirements . 32 SIST EN 60384-1:2016

IEC 60384-1:2016  IEC 2016 – 3 – 4.6.5 Conditions to be prescribed in the relevant specification . 32 4.7 Capacitance . 32 4.7.1 Measuring frequency and measuring voltage . 32 4.7.2 Measuring equipment . 33 4.7.3 Conditions to be prescribed in the relevant specification . 33 4.8 Tangent of loss angle and equivalent series resistance (ESR) . 33 4.8.1 Tangent of loss angle . 33 4.8.2 Equivalent series resistance (ESR) . 33 4.9 Leakage current . 34 4.9.1 Preconditioning . 34 4.9.2 Test method . 34 4.9.3 Power source . 34 4.9.4 Measuring accuracy . 34 4.9.5 Test circuit . 34 4.9.6 Conditions to be prescribed in the relevant specification . 34 4.10 Impedance . 34 4.11 Self-resonant frequency and inductance . 35 4.11.1 Self-resonant frequency (fr) . 35 4.11.2 Inductance . 38 4.11.3 Conditions to be prescribed in the relevant specification . 38 4.12 Outer foil termination . 38 4.13 Robustness of terminations . 39 4.13.1 General . 39 4.13.2 Test Ua1 – Tensile . 39 4.13.3 Test Ub – Bending (half of the sample) . 40 4.13.4 Test Uc – Torsion (remaining sample) . 40 4.13.5 Test Ud – Torque . 40 4.13.6 Visual examination . 40 4.14 Resistance to soldering heat . 41 4.14.1 Preconditioning and initial measurement . 41 4.14.2 Test procedure . 41 4.14.3 Recovery . 41 4.14.4 Final inspection, measurement and requirements . 41 4.15 Solderability . 41 4.15.1 General . 41 4.15.2 Preconditioning . 41 4.15.3 Test procedure . 42 4.15.4 Final inspection, measurements and requirements . 42 4.16 Rapid change of temperature . 42 4.16.1 Initial measurement . 42 4.16.2 Test procedure . 42 4.16.3 Final inspection, measurements and requirements . 42 4.17 Vibration . 42 4.17.1 Initial measurement . 42 4.17.2 Test procedure . 43 4.17.3 Electrical test (intermediate measurement) . 43 4.17.4 Final inspection, measurements and requirements . 43 4.18 Bump (repetitive shock) . 43 4.18.1 Initial measurement . 43 SIST EN 60384-1:2016

– 4 – IEC 60384-1:2016  IEC 2016 4.18.2 Test procedure . 43 4.18.3 Final inspection, measurements and requirements . 43 4.19 Shock . 43 4.19.1 Initial measurement . 43 4.19.2 Test procedure . 43 4.19.3 Final inspection, measurements and requirements . 44 4.20 Container sealing . 44 4.21 Climatic sequence . 44 4.21.1 General . 44 4.21.2 Initial measurements . 44 4.21.3 Dry heat . 44 4.21.4 Damp heat, cyclic, Test Db, first cycle . 44 4.21.5 Cold . 44 4.21.6 Low air pressure . 45 4.21.7 Damp heat, cyclic, Test Db, remaining cycles . 45 4.21.8 Final measurements . 45 4.22 Damp heat, steady state . 45 4.22.1 Initial measurement . 45 4.22.2 Test procedure . 45 4.22.3 Final inspection, measurements and requirements . 46 4.23 Endurance . 46 4.23.1 Initial measurements . 46 4.23.2 Test procedure . 46 4.23.3 Conditions to be prescribed in the relevant specification . 46 4.23.4 Test voltage . 46 4.23.5 Placement in the test chamber . 47 4.23.6 Recovery . 47 4.23.7 Final inspection, measurements and requirements . 47 4.24 Variation of capacitance with temperature . 48 4.24.1 Static method . 48 4.24.2 Dynamic method . 48 4.24.3 Methods of calculation . 49 4.25 Storage . 50 4.25.1 Storage at high temperature . 50 4.25.2 Storage at low temperature . 50 4.26 Surge . 51 4.26.1 Initial measurement . 51 4.26.2 Test procedure . 51 4.26.3 Final inspection, measurements and requirements . 52 4.26.4 Information to be given in the relevant detail specification . 52 4.27 Charge and discharge tests and inrush current test . 52 4.27.1 Initial measurement . 52 4.27.2 Test procedure . 52 4.27.3 Charge and discharge . 53 4.27.4 Inrush current . 54 4.27.5 Final inspection, measurements and requirements . 54 4.28 Pressure relief (for aluminium electrolytic capacitors) . 54 4.28.1 General . 54 4.28.2 AC test . 54 SIST EN 60384-1:2016

IEC 60384-1:2016  IEC 2016 – 5 – 4.28.3 DC test . 54 4.28.4 Pneumatic test . 54 4.28.5 Final inspection, measurements and requirements . 54 4.29 Characteristics at high and low temperature . 54 4.29.1 Test procedure . 54 4.29.2 Requirements . 55 4.30 Thermal stability test . 55 4.31 Component solvent resistance . 55 4.31.1 Initial measurements . 55 4.31.2 Test procedure . 55 4.31.3 Final inspection, measurements and requirements . 55 4.32 Solvent resistance of marking . 55 4.32.1 Test procedure . 55 4.32.2 Final inspection, measurements and requirements . 56 4.33 Mounting (for surface mount capacitors only) . 56 4.33.1 Substrate . 56 4.33.2 Wave soldering . 56 4.33.3 Reflow soldering . 56 4.34 Shear test . 59 4.34.1 Test procedure . 59 4.34.2 Final inspection, measurements and requirements . 59 4.35 Substrate bending test . 59 4.35.1 Test procedure . 59 4.35.2 Recovery . 60 4.35.3 Final inspection and requirements . 60 4.36 Dielectric absorption . 60 4.36.1 Test procedure . 60 4.36.2 Requirement . 61 4.37 Damp heat, steady state, accelerated . 61 4.37.1 Initial measurements . 61 4.37.2 Test methods . 61 4.37.3 Test procedures . 61 4.37.4 Final inspection, measurements and requirements . 61 4.38 Passive flammability . 61 4.38.1 Test procedure . 61 4.38.2 Final inspection, measurements and requirements . 62 4.39 High surge current test . 62 4.39.1 Initial measurements . 62 4.39.2 Test procedure . 62 4.39.3 Requirements for the charging circuit . 63 4.39.4 Nonconforming items . 63 4.40 Voltage transient overload (for aluminium electrolytic capacitors with non-solid electrolyte) . 63 4.40.1 Initial measurement . 63 4.40.2 Test procedure . 63 4.40.3 Final inspection, measurements and requirements . 65 4.40.4 Conditions to be prescribed in the relevant specification . 65 4.41 Whisker growth test . 65 4.41.1 General . 65 SIST EN 60384-1:2016

– 6 – IEC 60384-1:2016  IEC 2016 4.41.2 Preparation of specimen. 66 4.41.3 Initial measurement . 66 4.41.4 Test procedures . 66 4.41.5 Test severities . 66 4.41.6 Final inspection, measurements and requirements . 66 Annex A (informative)
Interpretation of sampling plans and procedures as described in IEC 60410 for use within quality assessment systems . 67 Annex B (informative)
Rules for the preparation of detail specifications for capacitors and resistors for electronic equipment for use within quality assessment
systems . 68 B.1 Drafting . 68 B.2 Reference standard . 68 B.3 Circulation . 68 Annex C (informative)
Layout of the first page of a PCP/CQC specification . 69 Annex D (informative)
Requirements for capability approval test report . 70 D.1 General . 70 D.2 Requirements . 70 D.3 Summary of test information (for each CQC) . 70 D.4 Measurement record . 70 Annex E (informative)
Guide for pulse testing of capacitors . 71 E.1 Overview. 71 E.2 Typical capacitor pulse conditions . 71 E.3 Effect of inductance on pulse testing . 72 Annex F (informative)
Guidance for the extension of endurance tests on fixed capacitors . 74 F.1 Overview. 74 F.2 Guidelines. 74 Annex G (normative)
Damp heat, steady state with voltage applied, for metallized film capacitors only . 75 G.1 Overview. 75 G.2 Test procedure . 75 Annex H (normative)
Accelerated damp heat, steady state, for multilayer ceramic capacitors only . 76 H.1 Mounting of capacitors . 76 H.2 Initial measurement . 76 H.3 Test procedure . 76 H.4 Recovery . 76 H.5 Final inspection, measurements and requirements . 76 Annex Q (informative)
Quality assessment procedures . 77 Q.1 General . 77 Q.1.1 Scope of this annex . 77 Q.1.2 Quality assessment definitions . 78 Q.1.3 Rework . 78 Q.1.4 Alternative test methods . 79 Q.1.5 Certified test records of released lots . 79 Q.1.6 Unchecked parameters . 79 Q.1.7 Delayed delivery . 79 Q.1.8 Repair . 79 Q.1.9 Registration of approvals . 80 Q.1.10 Manufacture outside the geographical limits . 80 SIST EN 60384-1:2016

IEC 60384-1:2016  IEC 2016 – 7 – Q.2 Qualification approval (QA) procedures . 80 Q.2.1 Eligibility for qualification approval. 80 Q.2.2 Application for qualification approval . 80 Q.2.3 Subcontracting . 80 Q.2.4 Test procedure for the initial product qualification approval . 80 Q.2.5 Granting of qualification approval . 80 Q.2.6 Maintenance of qualification approval . 81 Q.2.7 Quality conformance inspection . 81 Q.3 Capability approval (CA) procedures . 81 Q.3.1 General . 81 Q.3.2 Eligibility for capability approval . 81 Q.3.3 Application for capability approval . 82 Q.3.4 Subcontracting . 82 Q.3.5 Description of the capability . 82 Q.3.6 Demonstration and verification of capability . 82 Q.3.7 Granting of capability approval . 82 Q.3.8 Maintenance of capability approval . 82 Q.3.9 Quality conformance inspection . 82 Q.4 Technology approval (TA) procedure . 83 Q.4.1 General . 83 Q.4.2 Eligibility for technology approval . 83 Q.4.3 Application of technology approval . 83 Q.4.4 Subcontracting . 83 Q.4.5 Description of technology . 83 Q.4.6 Demonstration and verification of the technology . 83 Q.4.7 Granting of technology approval . 84 Q.4.8 Maintenance of technology approval . 84 Q.4.9 Quality conformance inspection . 84 Bibliography . 85
Figure 1 – Reactive power against frequency . 22 Figure 2 – Relation between category temperature range and applied voltage . 23 Figure 3 – Voltage-proof test circuit . 30 Figure 4 – Schematic diagram of the impedance measuring circuit . 35 Figure 5 – Capacitor mounting arrangement . 36 Figure 6 – Capacitor mounting arrangement . 37 Figure 7 – Typical diagram of an absorption oscillator-wavemeter . 37 Figure 8 – Schematic diagram of the measuring circuit . 38 Figure 9 – Test circuit . 39 Figure 10 – Test circuit for electrolytic capacitors . 47 Figure 11 – Relay circuit . 51 Figure 12 – Thyristor circuit . 51 Figure 13 – Voltage waveform across capacitor . 52 Figure 14 – Voltage and current waveform . 53 Figure 15 – Suitable substrate for mechanical tests . 58 Figure 16 – Suitable substrate for electrical tests . 59 SIST EN 60384-1:2016

– 8 – IEC 60384-1:2016  IEC 2016 Figure 17 – High surge current test . 63 Figure 18 – Voltage transient overload test circuit . 64 Figure 19 – Voltage waveform . 65
Table 1 – Referee conditions. 26 Table 2 – Measurement of insulation resistance . 27 Table 3 – Measuring points . 29 Table 4 – Tensile force . 40 Table 5 – Torque . 40 Table 6 – Number of cycles . 45 Table 7 – Severities and requirements . 62
IEC 60384-1:2016  IEC 2016 – 9 – INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –
Part 1: Generic specification
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publ
...