SIST EN 60512-16-7:2008
(Main)Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping (IEC 60512-16-7:2008)
Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping (IEC 60512-16-7:2008)
IEC 60512-16-7:2008 details a standard test method to assess the effectiveness of contacts to resist deformation (damage) from crimping operations.
Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 16-7: Mechanische Prüfungen an Kontakten und Anschlüssen - Prüfung 16g: Kontaktverformung nach dem Crimpen (IEC 60512-16-7:2008)
Connecteurs pour équipements électroniques - Essais et mesures - Partie 16-7: Essais mécaniques des contacts et des sorties - Essai 16g: Mesure de la déformation d'un contact après sertissage (CEI 60512-16-7:2008)
La CEI 60512-16-7:2008 détaille une méthode d'essai normalisée pour évaluer l'efficacité de la résistance des contacts à la déformation (détérioration) due aux opérations de sertissage.
Konektorji za elektronsko opremo - Preskusi in meritve - 16-7. del: Mehanski preskusi na kontaktih in priključkih - Preskus 16g: Merjenje deformacije kontakta po stiskanju (IEC 60512-16-7:2008)
General Information
- Status
- Published
- Publication Date
- 13-Oct-2008
- Technical Committee
- I11 - Imaginarni 11
- Current Stage
- 6060 - National Implementation/Publication (Adopted Project)
- Start Date
- 07-Oct-2008
- Due Date
- 12-Dec-2008
- Completion Date
- 14-Oct-2008
Relations
- Effective Date
- 03-Feb-2026
- Effective Date
- 03-Feb-2026
- Effective Date
- 03-Feb-2026
- Effective Date
- 03-Feb-2026
Overview
SIST EN 60512-16-7:2008 - also published as IEC 60512-16-7:2008 - specifies a standard test method for measuring the deformation of contacts used in connectors for electronic equipment after crimping. Developed by the European Committee for Electrotechnical Standardization (CENELEC / CLC), this document forms part of the EN 60512 series, supporting consistent mechanical performance assessment of connectors by standardizing how the deformation (or damage) to connector contacts is evaluated post-crimping.
This standard aims to ensure quality and reliability in electronic connectors, particularly where crimped terminations are used, by providing objective criteria to evaluate the effects of crimping techniques and tooling on component integrity.
Key Topics
- Standardized Test Methodology: Defines procedures for testing contact deformation after crimping, ensuring reliable and repeatable results.
- Applicability: While primarily designed for cylindrical and machined contacts, the test method is suitable for various contact geometries used in electronic connectors.
- Test Preparation: Specifies requirements for specimen preparation, including types and quantities of contacts, wire protrusion, and use of specified or approved crimping tools.
- Measurement Requirements: Details the measurement technique before and after crimping, using appropriate precision tools such as dial indicators and mounting collets to assess deformation.
- Acceptance Criteria: Visual inspection and quantitative deformation measurements are compared with values specified in the detail specification to assess pass/fail outcomes.
- Documentation: Requires full documentation of the crimping tools, test points, permissible deformation values, and any deviations from standard method.
Applications
SIST EN 60512-16-7:2008 is widely applied in the electronic and electrical connectors industry to:
- Quality Assurance: Provides manufacturers and test laboratories with a uniform method for validating the mechanical durability and performance of crimped connectors.
- Connector Design and Production: Enables designers to specify robust connector types and qualifies production processes to meet defined reliability standards.
- Procurement and Compliance: Serves procurement teams and system integrators needing evidence of conformity to international standards for safety, reliability, and compatibility.
- Failure Analysis and Process Improvement: Helps identify process or material deficiencies by providing a defect-focused test for contact deformation, leading to improvements in crimping technology or connector design.
This standard is crucial for industries where the integrity of electronic connections is vital, including automotive, telecommunications, aerospace, industrial automation, and consumer electronics.
Related Standards
Implementing SIST EN 60512-16-7:2008 often involves coordination with several other important international standards, including:
- EN 60512-1 / IEC 60512-1: General requirements and test methods for connectors for electronic equipment.
- EN 60512-1-1: Visual examination procedures for connector contacts.
- EN 60352-2 / IEC 60352-2: Solderless connections - General requirements and crimped connections.
These related standards provide the foundational requirements, test set-ups, and practical guidance necessary for the correct application and interpretation of mechanical testing results on connectors.
Keywords: SIST EN 60512-16-7:2008, IEC 60512-16-7:2008, connector contact deformation, crimping test, electronic connectors, mechanical testing, standardized measurement, CENELEC, connector reliability, quality assurance.
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Frequently Asked Questions
SIST EN 60512-16-7:2008 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping (IEC 60512-16-7:2008)". This standard covers: IEC 60512-16-7:2008 details a standard test method to assess the effectiveness of contacts to resist deformation (damage) from crimping operations.
IEC 60512-16-7:2008 details a standard test method to assess the effectiveness of contacts to resist deformation (damage) from crimping operations.
SIST EN 60512-16-7:2008 is classified under the following ICS (International Classification for Standards) categories: 19.060 - Mechanical testing; 31.220.10 - Plug-and-socket devices. Connectors. The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN 60512-16-7:2008 has the following relationships with other standards: It is inter standard links to SIST EN 60512-1-1:2003, SIST EN IEC 60352-9:2024, SIST EN IEC 60352-2:2025, SIST EN IEC 62282-2-100:2020. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
SIST EN 60512-16-7:2008 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
SLOVENSKI STANDARD
01-december-2008
.RQHNWRUML]DHOHNWURQVNRRSUHPR3UHVNXVLLQPHULWYHGHO0HKDQVNL
SUHVNXVLQDNRQWDNWLKLQSULNOMXþNLK3UHVNXVJ0HUMHQMHGHIRUPDFLMHNRQWDNWD
SRVWLVNDQMX,(&
Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical
tests on contacts and terminations - Test 16g: Measurement of contact deformation after
crimping (IEC 60512-16-7:2008)
Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 16-7:
Mechanische Prüfungen an Kontakten und Anschlüssen - Prüfung 16g:
Kontaktverformung nach dem Crimpen (IEC 60512-16-7:2008)
Connecteurs pour équipements électroniques - Essais et mesures - Partie 16-7: Essais
mécaniques des contacts et des sorties - Essai 16g: Mesure de la déformation d'un
contact après sertissage (CEI 60512-16-7:2008)
Ta slovenski standard je istoveten z: EN 60512-16-7:2008
ICS:
19.060 Mehansko preskušanje Mechanical testing
31.220.10 9WLþLLQYWLþQLFHNRQHNWRUML Plug-and-socket devices.
Connectors
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 60512-16-7
NORME EUROPÉENNE
September 2008
EUROPÄISCHE NORM
ICS 31.220.10
English version
Connectors for electronic equipment -
Tests and measurements -
Part 16-7: Mechanical tests on contacts and terminations -
Test 16g: Measurement of contact deformation after crimping
(IEC 60512-16-7:2008)
Connecteurs Steckverbinder
pour équipements électroniques - für elektronische Einrichtungen -
Essais et mesures - Mess- und Prüfverfahren -
Partie 16-7: Essais mécaniques Teil 16-7: Mechanische Prüfungen
des contacts et des sorties - an Kontakten und Anschlüssen -
Essai 16g: Mesure de la déformation Prüfung 16g: Kontaktverformung
d'un contact après sertissage nach dem Crimpen
(CEI 60512-16-7:2008) (IEC 60512-16-7:2008)
This European Standard was approved by CENELEC on 2008-08-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60512-16-7:2008 E
Foreword
The text of document 48B/1888/FDIS, future edition 1 of IEC 60512-16-7, prepared by SC 48B,
Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic
equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 60512-16-7 on 2008-08-01.
This standard is to be read in conjunction with EN 60512-1 and EN 60512-1-100 which explains the
structure of the EN 60512 series.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2009-05-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2011-08-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60512-16-7:2008 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 60352-2 NOTE Harmonized as EN 60352-2:2006 (not modified).
__________
- 3 - EN 60512-16-7:2008
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1) 2)
IEC 60512-1-1 - Connectors for electronic equipment - Tests EN 60512-1-1 2002
and measurements -
Part 1-1: General examination - Test 1a:
Visual examination
1)
Undated reference.
2)
Valid edition at date of issue.
IEC 60512-16-7
Edition 1.0 2008-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electronic equipment – Tests and measurements –
Part 16-7: Mechanical tests on contacts and terminations – Test 16g:
Measurement of contact deformation after crimping
Connecteurs pour équipements électroniques – Essais et mesures –
Partie 16-7: Essais mécaniques des contacts et des sorties – Essai 16g: Mesure
de la déformation d’un contact après sertissage
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
G
CODE PRIX
ICS 31.220.10 ISBN 2-8318-9882-X
– 2 – 60512-16-7 © IEC:2008
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 16-7: Mechanical tests on contacts and terminations –
Test 16g: Measurement of contact deformation after crimping
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accep
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