SIST EN 60749-36:2004
(Main)Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren -- Teil 36: Gleichmäßiges Beschleunigen
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques -- Partie 36: Accélération constante
Décrit un essai utilisé pour déterminer les effets d'accélération constante sur les dispositifs à semiconducteurs de type à cavité. Il s'agit d'un essai accéléré destiné à indiquer les types de faiblesses structurelles et mécaniques non nécessairement détectées dans les essais de chocs et de vibrations.
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003)
General Information
- Status
- Published
- Publication Date
- 30-Jun-2004
- Technical Committee
- I11 - Imaginarni 11
- Current Stage
- 6060 - National Implementation/Publication (Adopted Project)
- Start Date
- 01-Jul-2004
- Due Date
- 01-Jul-2004
- Completion Date
- 01-Jul-2004
Overview
EN 60749-36:2003 (IEC 60749-36) specifies a steady‑state acceleration test for cavity‑type semiconductor devices. It defines a constant‑acceleration procedure intended to reveal structural and mechanical weaknesses (package, internal metallisation, lead system, die/substrate attachments) that may not be detected by shock or vibration tests. The method can be used as a high‑stress destructive qualification test or, once limits are established, as a non‑destructive 100% in‑line screen to remove mechanically weak units.
Key topics and requirements
- Scope and purpose: Assess effects of constant acceleration on cavity‑type semiconductor packages to detect mechanical failure modes.
- Test apparatus: Equipment must apply the specified constant acceleration level for the required time.
- Test orientation and duration: Acceleration is applied for 1 minute in each principal orientation (both polarities on relevant axes - X, Y, Z) unless the procurement document specifies otherwise.
- Default stress level: Unless otherwise specified, test condition E applies (numeric stress levels are tabulated in the standard, e.g., condition E = 300 000).
- Stress level table: The standard lists a series of labeled test conditions (A, B, C … J) with increasing acceleration magnitudes for high‑stress characterization.
- Final measurements: After test, perform hermeticity testing, visual examination, and electrical measurements (parametric and functional).
- Failure criteria: A device is considered failed if hermeticity is lost, parametric limits are exceeded, functionality is not met, or package mechanical damage occurs (unless caused by handling/fixturing).
- Specification details to be declared: Acceleration amount, post‑test measurements, orientation/duration variations, sequence, and sample size.
Applications and who uses it
- Semiconductor manufacturers and device packaging engineers use EN 60749-36 for qualification of new package designs and materials.
- Reliability and test engineers apply it for failure analysis and to determine mechanical limits of dies, attachments and leadframes.
- Quality assurance and incoming‑inspection teams can implement the method as an in‑line mechanical screen after stress levels are established.
- Independent test laboratories and procurement specialists reference this standard when specifying mechanical stress requirements in contracts.
Related standards
- IEC 60068-2-7 (Environmental testing - Test Ga: Acceleration, steady state) - referenced for general environmental testing guidance.
- IEC 60749 (other parts) - broader mechanical and climatic test methods for semiconductor devices.
Keywords: EN 60749-36:2003, IEC 60749-36, acceleration steady state, semiconductor devices, cavity‑type, mechanical test, hermeticity, test condition E, constant acceleration, in‑line screening.
Frequently Asked Questions
SIST EN 60749-36:2004 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state". This standard covers: Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
SIST EN 60749-36:2004 is classified under the following ICS (International Classification for Standards) categories: 31.080.01 - Semiconductor devices in general. The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN 60749-36:2004 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
SLOVENSKI SIST EN 60749-36:2004
STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 36:
Acceleration, steady state (IEC 60749-36:2003)
ICS 31.080.01 Referenčna številka
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
EUROPEAN STANDARD EN 60749-36
NORME EUROPÉENNE
EUROPÄISCHE NORM April 2003
ICS 31.080.01
English version
Semiconductor devices –
Mechanical and climatic test methods
Part 36: Acceleration, steady state
(IEC 60749-36:2003)
Dispositifs à semiconducteurs – Halbleiterbauelemente –
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 36: Accélération constante Teil 36: Gleichmäßiges Beschleunigen
(CEI 60749-36:2003) (IEC 60749-36:2003)
This European Standard was approved by CENELEC on 2003-04-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-36:2003 E
Foreword
The text of document 47/1667/FDIS, future edition 1 of IEC 60749-36, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-36 on 2003-04-01.
This mechanical and climatic test method, as it relates to acceleration, steady state, is a complete
rewrite of the test contained in Clause 5, Chapter 2 of EN 60749:1999.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2006-04-01
Annexes designated "normative" are part of the body of the standard.
In this standard, annex ZA is normative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60749-36:2003 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 60749-36:2003
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1) 2)
IEC 60068-2-7 - Basic environmental testing procedures EN 60068-2-7 1993
Part 2: Tests - Test Ga and guidance:
Acceleration, steady state
1)
Undated reference.
2)
Valid edition at date of issue.
NORME CEI
INTERNATIONALE IEC
60749-36
INTERNATIONAL
Première édition
STANDARD
First edition
2003-02
Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques et climatiques –
Partie 36:
Accélération constante
Semiconductor devices –
Mechanical and climatic test methods –
Part 36:
Acceleration, steady state
IEC 2003 Droits de reproduction réservés Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
CODE PRIX
D
Commission Electrotechnique Internationale PRICE CODE
International Electrotechnical Commission
Международная Электротехническая Комиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue
60749-36 IEC:2003 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –
Part 36: Acceleration, steady state
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotech
...
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