IEC 60679-1:1997/AMD1:2002
(Amendment)Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Amendement 1 - Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 1: Spécification générique
General Information
- Status
- Published
- Publication Date
- 14-Jan-2002
- Technical Committee
- TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- Drafting Committee
- WG 7 - TC 49/WG 7
- Current Stage
- DELPUB - Deleted Publication
- Start Date
- 11-Apr-2007
- Completion Date
- 14-Feb-2026
Relations
- Effective Date
- 05-Sep-2023
- Effective Date
- 05-Sep-2023
Overview
IEC 60679-1:1997/AMD1:2002 is an Amendment 1 to the IEC 60679-1 standard, published by the International Electrotechnical Commission (IEC). This amendment refines and updates the generic specification for quartz crystal controlled oscillators of assessed quality. These oscillators are critical timing components widely used in electronic circuits, ensuring accuracy and stability in frequency control and selection. The amendment was prepared by IEC Technical Committee 49, focusing on piezoelectric and dielectric devices.
Key Topics
This amendment introduces key updates and clarifications in several technical areas relevant to quartz crystal oscillators:
- Annexes Integration: Incorporates Annexes A, B, and C as integral parts of the standard, replacing earlier classifications of annexes as informative.
- Load Circuit for Logic Drive (Annex A): Details circuits for load testing in logic applications.
- Latch-up Test (Annex B):
- Provides a procedure to assess the susceptibility of oscillators with CMOS integrated circuits to latch-up conditions.
- Stresses that the latch-up test is destructive and intended for device characterization or inspection, not for routine production.
- Specifies that testing conforms to IEC 60748-2 standards.
- Electrostatic Discharge (ESD) Sensitivity Classification (Annex C):
- Defines ESD and its impact on quartz crystal oscillators with CMOS ICs.
- Establishes test methods for leaded and surface-mount oscillators:
- Human Body Model (HBM) for leaded devices, following IEC/PAS 62179.
- Machine Model (MM) for SMD devices, following IEC/PAS 62180.
- Recommends a maximum test voltage of 2,000 V, adjustable by agreement.
- Addresses packaging and handling requirements for devices with varying ESD sensitivity.
Applications
Quartz crystal controlled oscillators are essential timing elements in a wide range of electronic applications. This amendment ensures increased precision and reliability by:
- Supporting designers and manufacturers in producing robust oscillators for consumer electronics, telecommunications, industrial controls, and computing equipment.
- Providing guidance on destructive testing such as latch-up and ESD sensitivity, supporting product characterization and quality assurance during development and inspection phases.
- Enhancing device safety and quality through rigorous procedures for identifying vulnerabilities in oscillator technology, especially for applications requiring high reliability in noisy or harsh environments.
- Facilitating compliance with global market requirements, aiding manufacturers and integrators to meet international standards for frequency control devices.
Related Standards
For more comprehensive compliance and up-to-date practices, the following IEC standards are referenced in IEC 60679-1:1997/AMD1:2002:
- IEC 60748-2:1997 - Digital integrated circuits: Procedures for testing latch-up in CMOS devices.
- IEC/PAS 62179 - Electrostatic discharge (ESD) sensitivity testing Human Body Model (HBM): Test methods for assessing ESD susceptibility.
- IEC/PAS 62180 - Electrostatic discharge (ESD) sensitivity testing Machine Model (MM): Relevant for surface-mount devices assembled by automated processes.
- IEC 60679-1 - The main specification for quartz crystal controlled oscillators of assessed quality.
By adhering to IEC 60679-1:1997/AMD1:2002, manufacturers and users ensure that quartz crystal oscillators are tested for critical reliability factors, paving the way for safer and more dependable electronic systems across various industries.
Frequently Asked Questions
IEC 60679-1:1997/AMD1:2002 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification". This standard covers: Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 60679-1:1997/AMD1:2002 is classified under the following ICS (International Classification for Standards) categories: 31.140 - Piezoelectric devices. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 60679-1:1997/AMD1:2002 has the following relationships with other standards: It is inter standard links to IEC 60679-1:1997, IEC 60679-1:2007. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 60679-1:1997/AMD1:2002 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
NORME CEI
INTERNATIONALE IEC
60679-1
INTERNATIONAL
STANDARD
AMENDEMENT 1
AMENDMENT 1
2002-01
Amendement 1
Oscillateurs pilotés par quartz
sous assurance de la qualité –
Partie 1:
Spécification générique
Amendment 1
Quartz crystal controlled oscillators
of assessed quality –
Part 1:
Generic specification
IEC 2002 Droits de reproduction réservés Copyright - all rights reserved
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
E
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue
– 2 – 60679-1 Amend. 1 © CEI:2002
AVANT-PROPOS
Le présent amendement a été établi par le comité d'études 49 de la CEI: Dispositifs piézo-
électriques et diélectriques pour la commande et le choix de la fréquence.
Le texte de cet amendement est issu des documents suivants:
FDIS Rapport de vote
49/523/FDIS 49/531/RVD
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant
abouti à l'approbation de cet amendement.
___________
Page 6
SOMMAIRE
Remplacer les titres des annexes par ce qui suit:
Annexe A Circuit de charge pour circuits logiques
Annexe B Essai de verrouillage
Annexe C Classification selon la sensibilité à la décharge électrostatique
Bibliographie
Page 8
AVANT-PROPOS
Remplacer, à la page 10, la phrase «L’annexe A fait partie intégrante de cette norme» par ce
qui suit :
Les annexes A, B et C font partie intégrante de cette norme.
Supprimer, à la page 10, la phrase «L’annexe B est donné uniquement à titre d’information».
Page 12
1.2 Références normatives
Insérer, à la page 14, les nouvelles normes suivantes:
CEI 60748-2:1997, Dispositifs à semiconducteurs – Circuits intégrés – Partie 2: Circuits
intégrés numériques
IEC/PAS 62179, Electrostatic discharge (ESD) sensitivity testing human body model (HBM)
(en anglais seulement)
IEC/PAS 62180, Electrostatic discharge (ESD) sensitivity testing machine model (MM) (en
anglais seulement)
Page 156
Insérer, après l’annexe A, les nouvelles annexes B et C.
60679-1 Amend.1 IEC:2002 – 3 –
FOREWORD
This amendment has been prepared by IEC technical committee 49: Piezoelectric and
dielectric devices for frequency control and selection.
The text of this amendment is based on the following documents:
FDIS Report on voting
49/523/FDIS 49/531/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
___________
Page 7
CONTENTS
Replace the titles of the annexes by the following:
Annex A Load circuit for logic drive
Annex B Latch-up test
Annex C Electrostatic discharge sensitivity classification
Bibliography
Page 9
FOREWORD
Replace, on page 11, the sentence ‘Annex A forms an integral part of this standard’ by the
following:
Annexes A, B and C form an integral part of this standard.
Delete, on page 11, the sentence ‘Annex B is for information only’.
Page 13
1.2 Normative references
Insert, on page 15, the following new standards:
IEC 60748-2:1997, Semiconductor devices – Integrated circuits – Part 2: Digital integrated
circuits
IEC/PAS 62179, Electrostatic discharge (ESD) sensitivity testing human body model (HBM)
IEC/PAS 62180, Electrostatic discharge (ESD) sensitivity testing machine model (MM)
Page 157
Insert, after annex A, the new annexes B and C.
– 4 – 60679-1 Amend. 1 © CEI:2002
Annexe B
(normative)
Essai de verrouillage
B.1 Définition
B.1.1 Verrouillage
Etat caractérisé par un chemin conducteur de faible impédance qui résulte (et persiste après)
d’une surtension à l’entrée, à la sortie ou à la source d’alimentation.
B.1.2 Procédure d’essai
L’essai de verrouillage dans les conditions statiques soumet le dispositif à des tensions
supérieures à celles qu’il rencontrerait dans les conditions normales de fonctionnement, et il
est même plus sévère que les méthodes d’essai dynamiques utilisant des niveaux de courant
et de tension similaires.
Cet essai, s’il est effectué conformément aux procédés définis dans cette norme, est une
méthode nécessaire et suffisante pour la caractérisation de la susceptibilité de verrouillage ou
de l’immunité des oscillateurs pilotés par quartz réalisés avec des circuits intégrés CMOS.
B.2 Méthode d’essai
B.2.1 Cet essai est destructif.
B.2.2 Cet essai est applicable seulement aux oscillateurs pilotés par quartz réalisés avec
des circuits intégrés CMOS.
B.2.3 Cet essai doit être effectué conformément à la CEI 60748-2.
B.2.4 Cet essai est une méthode recommandée. Il n’est pas une spécification. Les limites
d’essai ne sont pas données.
B.2.5 Cet essai est effectué uniquement dans un but de caractérisation et de contrôle. Il
n’est pas un essai de production en série.
60679-1 Amend.1 IEC:2002 – 5 –
Annex B
(normative)
Latch-up test
B.1 Definition
B.1.1 Latch-up
A state in which a low-impedance path results from (and persists following)
...
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