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IEC

PT 62607-6-4 - TC 113/PT 62607-6-4

TC 113/PT 62607-6-4

General Information

Status
Active
Work Field
Information technology
Parent
TC 113 - Nanotechnology for electrotechnical products and systems

Frequently Asked Questions

PT 62607-6-4 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 113/PT 62607-6-4". This committee has published 1 standards.

PT 62607-6-4 develops IEC standards in the area of Information technology. Currently, there are 1 published standards from this technical committee.

The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.

A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.

Standardization Organization
ICS
Directive
Mandate
50
IEC
IEC TS 62607-6-4:2016(Main)
Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Surface conductance measurement using resonant cavity

IEC TS 62607-6-4:2016(E) establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz. Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.

  • Technical specification
    18 pages
    English language
    sale 15% off
  • Technical specification
    18 pages
    English language
    sale 15% off
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