WG 7 - TC 113/WG 7
TC 113/WG 7
General Information
IEC TS 62876-3-2:2026 which is a Technical Specification, establishes a standardized method to determine
• volume fraction
for graphene by
• ellipsometry.
Thickness/composition measurements are evaluated by ellipsometry before and after the stability test. By model calculation, the volume fraction of graphene can be evaluated. Since the test method is non‑destructive, it can be used to assess the reliability and durability of graphene films on production lines.
• For graphene-capped copper for Cu interconnects in a semiconductor engineering, for example, the reliability and durability of the capping layer are evaluated.
• Gas sensors, gas barriers, transparent electrodes for solar cells, etc. are being researched and developed.
• This method is useful for non-destructive and quantitative evaluation of the volume fraction of graphene to assess the reliability and durability.
- Technical specification18 pagesEnglish languagesale 15% off
IEC TS 62876-3-4:2025, which is a Technical Specification, establishes a standardized guideline to assess
• reliability of metallic interfaces
of Ohmic-contacted field-effect transistors (FETs) using 2D nano-materials by quantifying
• linearity of current-voltage (I-V) output curves
for devices with various materials combinations of van der Waals (vdW) interfaces.
For metallic interfaces with 2D materials (eg. graphene, MoS2, MoTe2, WS2, WSe2, etc) and metals (eg. Ti, Cr, Au, Pd, In, Sb, etc), the reliability of Ohmic contact is quantified.
For FETs consisting of 2D materials-based channels (eg. MoS2, MoTe2, WS2, WSe2, etc), the reliability of Ohmic contact when varying contacting metal, channel length, channel thickness, applied voltage, and surface treatment condition is quantified.
The reliability of the metallic contacts is quantified from the linearity of I-V characteristics measured over extended time periods.
- Technical specification24 pagesEnglish languagesale 15% off
IEC TS 62876-4-1:2025, which is a Technical Specification, establishes a general reliability testing programme to verify the reliability of the performance of quantum dots nanomaterials, and quantum dot enabled light conversion films (Q-LCFs).
The Q-LCF is used as subassemblies for the fabrication of nano-enabled photoelectrical display devices, mainly liquid crystal display (LCD) currently, with other components.
This testing programme defines standardized aging conditions, methodologies and data assessment for Q-LCF product.
The results of these tests define a stability under standardized aging conditions for quantitative evaluation of the reliability of the Q-LCF.
The procedures specified in this document were designed for Q-LCF but can be extended to serve as a guideline for other kinds of light conversion films or related subassemblies as well.
- Technical specification24 pagesEnglish languagesale 15% off
Frequently Asked Questions
WG 7 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 113/WG 7". This committee has published 500 standards.
WG 7 develops IEC standards in the area of Information technology. Currently, there are 500 published standards from this technical committee.
The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.
A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.