SIST EN 300 417-5-2 V1.1.1:2003

SLOVENSKI STANDARD
01-december-2003
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Transmission and Multiplexing (TM); Generic requirements of transport functionality of
equipment; Part 5-2: Plesiochronous Digital Hierarchy (PDH) path layer functions;
Implementation Conformance Statement (ICS) proforma specification
Ta slovenski standard je istoveten z: EN 300 417-5-2 Version 1.1.1
ICS:
33.040.20 Prenosni sistem Transmission systems
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

European Standard (Telecommunications series)
Transmission and Multiplexing (TM);
Generic requirements of transport functionality of equipment;
Part 5-2: Plesiochronous Digital Hierarchy (PDH)
path layer functions;
Implementation Conformance Statement (ICS)
proforma specification
2 ETSI EN 300 417-5-2 V1.1.1 (1999-08)
Reference
DEN/TM-01015-5-2 (3v19iico.PDF)
Keywords
ICS, SDH, PDH , testing, transmission
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© European Telecommunications Standards Institute 1999.
All rights reserved.
ETSI
3 ETSI EN 300 417-5-2 V1.1.1 (1999-08)
Contents
Intellectual Property Rights.13
Foreword .13
Introduction .14
1 Scope.15
2 References.15
3 Definitions and abbreviations .16
3.1 Definitions . 16
3.2 Abbreviations. 16
4 Conformance to this ICS proforma specification .19
Annex A (normative): ICS proforma for EN 300 417-5-1.20
A.1 Guidance for completing the ICS proforma.20
A.1.1 Purposes and structure . 20
A.1.2 Abbreviations and conventions. 20
A.1.3 Instructions for completing the ICS proforma . 22
Annex B (normative): ICS proforma for P4e Path Layer .23
B.1 Identification of the implementation.23
B.1.1 Date of the statement . 23
B.1.2 Implementation Under Test (IUT) identification . 23
B.1.3 System Under Test (SUT) identification. 24
B.1.4 Product supplier. 24
B.1.5 Client . 25
B.1.6 ICS contact person. 25
B.2 Identification of the ETS.26
B.3 Global statement of conformance of P4e Path Layer .26
B.4 P4e Path Layer Functions .26
B.4.0 P4e Path Layer Description . 26
B.4.0.1 Characteristic Information. 28
B.4.0.2 Adapted information . 29
B.4.1 P4e Connection function. 29
B.4.2 P4e Trail Termination functions . 29
B.4.2.1 P4e Trail Termination Source P4e_TT_So . 29
B.4.2.1.1 Processes (P4e_TT_So). 29
B.4.2.2 P4e Trail Termination Sink P4e_TT_Sk. 30
B.4.2.2.1 Management information (P4e_TT_Sk). 30
B.4.2.2.2 Processes (P4e_TT_Sk). 30
B.4.2.2.3 Defects (P4e_TT_Sk) . 31
B.4.2.2.4 Consequent actions (P4e_TT_Sk) . 31
B.4.2.2.5 Defect Correlations (P4e_TT_Sk). 31
B.4.2.2.6 Performance monitoring (P4e_TT_Sk) . 32
B.4.3 P4e Adaptation functions. 32
B.4.3.1 P4e to P31x Adaptation Source P4e/P31x_A_So/i . 32
B.4.3.1.1 Management information (P4e/P31x_A_So). 32
B.4.3.1.2 Processes (P4e/P31x_A_So) . 33
B.4.3.2 P4e to P31x Adaptation Sink P4e/P31x_A_Sk/i. 34
B.4.3.2.1 Management information (P4e/P31x_A_Sk). 34
B.4.3.2.2 Processes (P4e/P31x_A_Sk). 34
B.4.3.2.3 Consequent actions (P4e/P31x_A_Sk) . 36
ETSI
4 ETSI EN 300 417-5-2 V1.1.1 (1999-08)
B.4.3.3 P4e to P31e Adaptation Source P4e/P31e_A_So/i. 36
B.4.3.3.1 Management information (P4e/P31e_A_So). 36
B.4.3.3.2 Processes (P4e/P31e_A_So). 37
B.4.3.4 P4e to P31e Adaptation Sink P4e/P31e_A_Sk/i . 38
B.4.3.4.1 Management information(P4e/P31e_A_Sk) . 38
B.4.3.4.2 Processes (P4e/P31e_A_Sk). 39
B.4.3.4.3 Defects (P4e/P31e_A_Sk) . 41
B.4.3.4.4 Consequent actions (P4e/P31e_A_Sk) . 41
B.4.3.4.5 Defect Correlations (P4e/P31e_A_Sk) . 41
B.4.3.5 P4e to P31s Adaptation Source P4e/P31s_A_So/i. 42
B.4.3.5.1 Management information (P4e/P31s_A_So/i) . 42
B.4.3.5.2 Processes (P4e/P31s_A_So/i). 42
B.4.3.6 P4e to P31s Adaptation Sink P4e/P31s_A_Sk/i. 43
B.4.3.6.1 Management information (P4e/P31s_A_Sk) . 44
B.4.3.6.2 Processes (P4e/P31s_A_Sk). 44
B.4.3.6.3 Defects (P4e/P31s_A_Sk) . 46
B.4.3.6.4 Consequent actions (P4e/P31s_A_Sk). 47
B.4.3.6.5 Defect correlation (P4e/P31s_A_Sk). 47
B.4.4 P4e Layer Monitoring Functions . 47
B.4.4.1 P4e Layer Non-intrusive Monitoring Function P4em_TT_Sk .47
B.4.4.1.1 Management information (P4em_TT_Sk). 47
B.4.4.1.2 Processes . 48
B.4.4.1.3 Defects (P4em_TT_Sk) . 48
B.4.4.1.4 Consequent actions (P4em_TT_Sk) . 49
B.4.4.1.5 Defect Correlations (P4em_TT_Sk). 49
B.4.4.1.6 Performance Monitoring (P4em_TT_Sk). 49
B.4.5 P4e PDH Equipment Clock Adaptation Source P4e_PEC. 49
B.4.5.1 Processes (P4e_PEC) . 50
Annex C (normative): ICS proforma for P31e Path Layer .51
C.1 Identification of the implementation.51
C.1.1 Date of the statement . 51
C.1.2 Implementation Under Test (IUT) identification . 51
C.1.3 System Under Test (SUT) identification. 51
C.1.4 Product supplier. 52
C.1.5 Client . 52
C.1.6 ICS contact person. 53
C.2 Identification of the ETS.53
C.3 Global statement of conformance of P31e Path Layer .54
C.4 P31e Path Layer Functions .54
C.4.0 P31e Path Layer Description . 54
C.4.0.1 Characteristic Information. 56
C.4.0.2 Adapted information . 56
C.4.1 P31e Connection function. 56
C.4.2 P31e Trail Termination functions . 56
C.4.2.1 P31e Trail Termination Source P31e_TT_So . 57
C.4.2.1.1 Processes (P31e_TT_So). 57
C.4.2.2 P31e Trail Termination Sink P31e_TT_Sk. 57
C.4.2.2.1 Management information (P31e_TT_Sk). 57
C.4.2.2.2 Processes (P31e_TT_Sk). 58
C.4.2.2.3 Defects (P31e_TT_Sk) . 59
C.4.2.2.4 Consequent actions (P31e_TT_Sk) . 59
C.4.2.2.5 Defect Correlations (P31e_TT_Sk). 59
C.4.2.2.6 Performance monitoring (P31e_TT_Sk) . 59
C.4.3 P31e Adaptation functions. 60
C.4.3.1 P31e to P22x Adaptation Source P31e/P22x_A_So/i . 60
C.4.3.1.1 Management information (P31e/P22x_A_So). 60
C.4.3.1.2 Processes (P31e/P22x_A_So) . 60
ETSI
5 ETSI EN 300 417-5-2 V1.1.1 (1999-08)
C.4.3.2 P31e to P22x Adaptation Sink P31e/P22x_A_Sk/i. 61
C.4.3.2.1 Management information (P31e/P22x_A_Sk). 62
C.4.3.2.2 Processes (P31e/P22x_A_Sk). 62
C.4.3.2.3 Consequent actions (P31e/P22x_A_Sk) . 64
C.4.3.3 P31e to P22e Adaptation Source P31e/P22e_A_So/i. 64
C.4.3.3.1 Management information (P31e/P22e_A_So/i). 64
C.4.3.3.2 Processes (P31e/P22e_A_So/i) . 65
C.4.3.4 P31e to P22e Adaptation Sink P31e/P22e_A_Sk/i . 66
C.4.3.4.1 Management information(P31e/P22e_A_Sk/i). 66
C.4.3.4.2 Processes (P31e/P22e_A_Sk). 66
C.4.3.4.3 Defects (P31e/P22e_A_Sk) . 69
C.4.3.4.4 Consequent actions (P31e/P22e_A_Sk) . 69
C.4.3.4.5 Defect Correlations (P31e/P22e_A_Sk) . 69
C.4.4 P31e Layer Monitoring Functions . 70
C.4.4.1 P31e Layer Non-intrusive Monitoring Function P31em_TT_Sk . 70
C.4.4.1.1 Management information (P31em_TT_Sk). 70
C.4.4.1.2 Processes . 70
C.4.4.1.3 Defects (P31em_TT_Sk) . 71
C.4.4.1.4 Consequent actions (P31em_TT_Sk) . 71
C.4.4.1.5 Defect Correlations (P31em_TT_Sk). 71
C.4.4.1.6 Performance Monitoring (P31em_TT_Sk). 72
C.4.5 P31e PDH Equipment Clock Adaptation Source P31e_PEC. 72
C.4.5.1 Processes (P31em_TT_Sk) . 72
Annex D (normative): ICS proforma for P22e Path Layer .73
D.1 Identification of the implementation.73
D.1.1 Date of the statement . 73
D.1.2 Implementation Under Test (IUT) identification . 73
D.1.3 System Under Test (SUT) identification. 74
D.1.4 Product supplier. 74
D.1.5 Client . 75
D.1.6 ICS contact person. 75
D.2 Identification of the ETS.75
D.3 Global statement of conformance of P22e Path Layer .76
D.4 P22e Path Layer Functions .76
D.4.0 P22e Path Layer Description . 76
D.4.0.1 Characteristic Information. 77
D.4.0.2 Adapted information . 78
D.4.1 P22e Connection function. 78
D.4.2 P22e Trail Termination functions . 78
D.4.2.1 P22e Trail Termination Source P22e_TT_So . 78
D.4.2.1.1 Processes (P22e_TT_So). 78
D.4.2.2 P22e Trail Termination Sink P22e_TT_Sk. 79
D.4.2.2.1 Management information (P22e_TT_Sk). 79
D.4.2.2.2 Processes (P22e_TT_Sk). 79
D.4.2.2.3 Defects (P22e_TT_Sk) . 80
D.4.2.2.4 Consequent actions (P22e_TT_Sk) . 80
D.4.2.2.5 Defect Correlations (P22e_TT_Sk). 80
D.4.2.2.6 Performance monitoring (P22e_TT_Sk) . 81
D.4.3 P22e Adaptation functions. 81
D.4.3.1 P22e to P12x Adaptation Source P22e/P12x_A_So/i . 81
D.4.3.1.1 Management information (P22e/P12x_A_So). 81
D.4.3.1.2 Processes (P22e/P12x_A_So) . 81
D.4.3.2 P22 . 82
D.4.3.2.1 Management information (P22e/P12x_A_Sk). 83
D.4.3.2.2 Processes (P22e/P12x_A_Sk). 83
D.4.3.2.3 Consequent actions (P22e/P12x_A_Sk) . 85
D.4.3.3 P22e to P12s Adaptation Source P22e/P12s_A_So/i. 85
ETSI
6 ETSI EN 300 417-5-2 V1.1.1 (1999-08)
D.4.3.3.1 Management information (P22e/P12s_A_So/i) . 85
D.4.3.3.2 Processes (P22e/P12s_A_So/i). 85
D.4.3.4 P22e to P12s Adaptation Sink P22e/P12s_A_Sk/i. 86
D.4.3.4.1 Management information (P22e/P12s_A_Sk) . 87
D.4.3.4.2 Processes (P22e/P12s_A_Sk). 87
D.4.3.4.3 Defects (P22e/P12s_A_Sk) . 89
D.4.3.4.4 Consequent actions (P22e/P12s_A_Sk). 90
D.4.3.4.5 Defect correlation (P22e/P12s_A_Sk). 90
D.4.4 P22e Layer Monitoring Functions . 90
D.4.4.1 P22e Layer Non-intrusive Monitoring Function P22em_TT_Sk . 90
D.4.4.1.1 Management information (P22em_TT_Sk). 90
D.4.4.1.2 Processes . 91
D.4.4.1.3 Defects (P22em_TT_Sk) . 92
D.4.4.1.4 Consequent actions (P22em_TT_Sk) . 92
D.4.4.1.5 Defect Correlations (P22em_TT_Sk). 92
D.4.4.1.6 Performance Monitoring (P22em_TT_Sk). 92
D.4.5 P22e PDH Equipment Clock Adaptation Source P22e_PEC. 93
D.4.5.1 Processes (P22em_TT_Sk) . 93
Annex E (normative): ICS proforma for P12s Path Layer.94
E.1 Identification of the implementation.94
E.1.1 Date of the statement . 94
E.1.2 Implementation Under Test (IUT) identification . 94
E.1.3 System Under Test (SUT) identification. 95
E.1.4 Product supplier. 95
E.1.5 Client . 96
E.1.6 ICS contact person. 96
E.2 Identification of the ETS.96
E.3 Global statement of conformance of P12s Path Layer.97
E.4 P12s Path Layer Functions.97
E.4.0 P12s Path Layer Description. 97
E.4.0.1 Characteristic Information. 98
E.4.0.2 Adapted information . 99
E.4.1 P12s Connection function . 99
E.4.2 P12s Trail Termination functions . 99
E.4.2.1 P12s Trail Termination Source P12s_TT_So. 99
E.4.2.1.1 Management information (P12s_TT_So) . 99
E.4.2.1.2 Processes (P12s_TT_So). 100
E.4.2.1.3 Consequent actions (P12s_TT_So) . 101
E.4.2.2 P12s Trail Termination Sink P12s_TT_Sk . 101
E.4.2.2.1 Management information (P12s_TT_Sk) . 102
E.4.2.2.2 Processes (P12s_TT_Sk). 103
E.4.2.2.3 Defects (P12s_TT_Sk) . 104
E.4.2.2.4 Consequent actions (P12s_TT_Sk). 105
E.4.2.2.5 Defect Correlations (P12s_TT_Sk) . 105
E.4.2.2.6 Performance monitoring (P12s_TT_Sk). 106
E.4.3 P12s Adaptation functions . 106
E.4.3.1 P12s to P0-31c Adaptation Source P12s/P0-31c_A_So. 106
E.4.3.1.1 Management information (P12s/P0-31c_A_So). 106
E.4.3.1.2 Processes (P12s/P0-31c_A_So). 107
E.4.3.2 P12s to P0-31c Adaptation Sink P12s/P0-31c_A_Sk . 107
E.4.3.2.1 Management information (P12s/P0-31c_A_Sk). 107
E.4.3.2.2 Processes (P12s/P0-31c_A_Sk). 108
E.4.3.2.3 Consequent actions (P12s/P0-31c_A_Sk) . 108
E.4.3.3 P12s to SD adaptation source P12s/SD_A_So. 108
E.4.3.4 P12s to SD adaptation sink P12s/SD_A_Sk. 108
E.4.3.5 P12s to ATM VP compound adaptation source P12s/Avp_A_So. 108
E.4.3.6 P12s to ATM VP compound adaptation sink P12s/Avp_A_Sk . 109
ETSI
7 ETSI EN 300 417-5-2 V1.1.1 (1999-08)
E.4.3.7 P12s Layer Clock adaptation source P12s-LC_A_So . 109
E.4.4 P12s Layer Monitoring Functions. 109
E.4.4.1 P12s Layer Non-intrusive Monitoring Function P12sm_TT_Sk. 109
E.4.4.1.1 Management information (P12sm_TT_Sk) . 109
E.4.4.1.2 Processes . 110
E.4.4.1.3 Defects (P12sm_TT_Sk) . 112
E.4.4.1.4 Consequent actions (P12sm_TT_Sk). 113
E.4.4.1.5 Defect Correlations (P12sm_TT_Sk) . 113
E.4.4.1.6 Performance Monitoring (P12sm_TT_Sk) . 114
Annex F (normative): ICS proforma for P31s Path Layer.115
F.1 Identification of the implementation.115
F.1.1 Date of the statement . 115
F.1.2 Implementation Under Test (IUT) identification . 115
F.1.3 System Under Test (SUT) identification. 116
F.1.4 Product supplier. 116
F.1.5 Client . 117
F.1.6 ICS contact person. 117
F.2 Identification of the ETS.117
F.3 Global statement of conformance of P31s Path Layer.118
F.4 P31s Path Layer Functions.118
F.4.0 P31s Path Layer Description. 118
F.4.0.1 Characteristic Information. 120
F.4.0.2 Adapted information . 121
F.4.1 P31s Connection function . 121
F.4.2 P31s Trail Termination functions . 121
F.4.2.1 P31s Trail Termination Source P31s_TT_So. 121
F.4.2.1.1 Management information (P31s_TT_So) . 121
F.4.2.1.2 Processes (P31s_TT_So). 122
F.4.2.2 P31s Trail Termination Sink P31s_TT_Sk . 122
F.4.2.2.1 Management information (P31s_TT_Sk) . 123
F.4.2.2.2 Processes (P31s_TT_Sk). 124
F.4.2.2.3 Defects (P31s_TT_Sk) . 125
F.4.2.2.4 Consequent actions (P31s_TT_Sk). 126
F.4.2.2.5 Defect Correlations (P31s_TT_Sk) . 126
F.4.2.2.6 Performance monitoring (P31s_TT_Sk). 127
F.4.3 P31s Adaptation functions . 127
F.4.3.1 P31s to VC-12, VC-11 Compound Adaptation Source P31s/SX_A_So . 127
F.4.3.1.1 P31s to TUG Adaptation Source P31s/TUG_A_So . 128
F.4.3.1.1.1 Management information (P31s/TUG_A_So) . 128
F.4.3.1.1.2 Processes (P31s/TUG_A_So) . 128
F.4.3.1.2 TUG Termination Source TUG_T_So . 129
F.4.3.1.3 TUG to S12 Adaptation Source TUG/S12_A_So . 129
F.4.3.1.3.1 Management information (TUG/S12_A_So). 129
F.4.3.1.3.2 Processes (TUG/S12_A_So). 130
F.4.3.1.3.3 Consequent actions (TUG/S12_A_So) . 131
F.4.3.1.4 TUG to S11 Adaptation Source TUG/S11*_A_So . 131
F.4.3.1.4.1 Management information (TUG/S11*_A_So) . 131
F.4.3.1.4.2 Processes (TUG/S11*_A_So). 132
F.4.3.1.4.3 Consequent actions (TUG/S11*_A_So) . 133
F.4.3.2 P31s to VC-12, VC-11 Compound Adaptation Sink P31s/SX_A_Sk. 133
F.4.3.2.1 P31s to TUG Adaptation Sink P31s/TUG_A_Sk . 134
F.4.3.2.1.1 Management information (P31s/TUG_A_Sk) . 134
F.4.3.2.1.2 Processes (P31s/TUG_A_Sk) . 134
F.4.3.2.1.3 Defects (P31s/TUG_A_Sk). 135
F.4.3.2.1.4 Consequent actions (P31s/TUG_A_Sk). 136
F.4.3.2.1.5 Defect Correlations (P31s/TUG_A_Sk) . 136
F.4.3.2.2 TUG Termination Sink TUG_T_Sk . 136
ETSI
8 ETSI EN 300 417-5-2 V1.1.1 (1999-08)
F.4.3.2.2.1 Consequent actions (TUG_T_Sk). 136
F.4.3.2.3 TUG to S12 Adaptation Sink TUG/S12_A_Sk . 136
F.4.3.2.3.1 Management information (TUG/S12_A_Sk) . 137
F.4.3.2.3.2 Processes (TUG/S12_A_Sk). 137
F.4.3.2.3.3 Defects (TUG/S12_A_Sk) . 138
F.4.3.2.3.4 Consequent actions (TUG/S12_A_Sk) . 138
F.4.3.2.3.5 Defect Correlations (TUG/S12_A_Sk) .
...