SIST EN 61189-2-721:2015

SLOVENSKI STANDARD
01-september-2015
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Test methods for electrical materials, printed boards and other interconnection structures
and assemblies - Part 2-721: Test methods for materials for interconnection structures -
Measurement of Relative Permittivity and Loss Tangent for Copper Clad Laminate at
Microwave Frequency Using Split Post Dielectric Resonator
Prüfverfahren für Elektromaterialien, Leiterplatten und andere Verbindungsstrukturen
und Baugruppen - Teil 2-721: Prüfverfahren für Materialien für Verbindungsstrukturen -
Messung der relativen Permittivität und des Verlustfaktors von kupferkaschiertem
Laminat im Mikrowellen-Frequenzbereich unter Verwendung eines Split Post
dielektrischen Resonators
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

Méthodes d'essai pour les matériaux électriques, les cartes imprimées et autres
structures d'interconnexion et ensembles - Partie 2-721: Méthodes d'essai des matériaux
pour structures d'interconnexion - Mesure de la permittivité relative et de la tangente de
perte pour les stratifiés recouverts de cuivre en hyperfréquences à l'aide d'un résonateur
diélectrique en anneaux fendus
Ta slovenski standard je istoveten z: EN 61189-2-721:2015
ICS:
31.180 7LVNDQDYH]MD7,9LQWLVNDQH Printed circuits and boards
SORãþH
31.190 Sestavljeni elektronski Electronic component
elementi assemblies
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 61189-2-721

NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2015
ICS 31.180
English Version
Test methods for electrical materials, printed boards and other
interconnection structures and assemblies - Part 2-721: Test
methods for materials for interconnection structures -
Measurement of relative permittivity and loss tangent for copper
clad laminate at microwave frequency using split post dielectric
resonator
(IEC 61189-2-721:2015)
Méthodes d'essai pour les matériaux électriques, les cartes Prüfverfahren für Elektromaterialien, Leiterplatten und
imprimées et autres structures d'interconnexion et andere Verbindungsstrukturen und Baugruppen - Teil 2-
ensembles - Partie 2-721: Méthodes d'essai des matériaux 721: Prüfverfahren für Verbindungsstrukturen (Leiterplatten)
pour structures d'interconnexion - Mesure de la permittivité - Messung der relativen Permittivität und des Verlustfaktors
relative et de la tangente de perte pour les stratifiés von kupferkaschiertem Laminat im Mikrowellen-
recouverts de cuivre en hyperfréquences à l'aide d'un Frequenzbereich unter Verwendung eines Split Post
résonateur diélectrique en anneaux fendus dielektrischen Resonators
(IEC 61189-2-721:2015) (IEC 61189-2-721:2015)
This European Standard was approved by CENELEC on 2015-06-03. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 61189-2-721:2015 E

European foreword
The text of document 91/1246/FDIS, future edition 1 of IEC 61189-2-721, prepared by
IEC/TC 91 "Electronics assembly technology" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 61189-2-721:2015.

The following dates are fixed:
(dop) 2016-03-03
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2018-06-03
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 61189-2-721:2015 was approved by CENELEC as a
European Standard without any modification.
IEC 61189-2-721 ®
Edition 1.0 2015-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Test methods for electrical materials, printed boards and other interconnection

structures and assemblies –
Part 2-721: Test methods for materials for interconnection structures –

Measurement of relative permittivity and loss tangent for copper clad laminate

at microwave frequency using split post dielectric resonator

Méthodes d'essai pour les matériaux électriques, les cartes imprimées et autres

structures d'interconnexion et ensembles –

Partie 2-721: Méthodes d'essai des matériaux pour structures d'interconnexion –

Mesure de la permittivité relative et de la tangente de perte pour les stratifiés

recouverts de cuivre en hyperfréquences à l'aide d'un résonateur diélectrique

en anneaux fendus
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.180 ISBN 978-2-8322-2648-3

– 2 – IEC 61189-2-721:2015 © IEC 2015
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Test specimens . 6
2.1 Specimen size . 6
2.2 Preparation . 7
2.3 Marking . 7
2.4 Thickness . 7
3 Equipment/apparatus . 7
3.1 General . 7
3.2 Vector network analyzer (VNA) . 8
3.3 SPDR test fixture . 8
3.3.1 General . 8
3.3.2 Parameters . 8
3.3.3 Frequency . 8
3.4 Verify unit . 9
3.5 Micrometer . 9
3.6 Circulating oven . 9
3.7 Test chamber . 9
4 Procedure . 9
4.1 Preconditioning . 9
4.2 Testing of relative permittivity and loss tangent at room temperature . 9
4.2.1 Test conditions . 9
4.2.2 Preparation . 9
4.2.3 Fixture . 10
4.2.4 Connection to VNA . 10
4.2.5 VNA parameter . 10
4.2.6 Frequency and Q-factor without specimen . 10
4.2.7 Micrometer . 10
4.2.8 Setting the specimen . 10
4.2.9 Frequency and Q-factor with specimen . 10
4.2.10 Comparison . 10
4.2.11 Calculation . 11
4.2.12 Change the specimen . 12
4.2.13 Change in test frequency . 12
4.3 Testing of relative permittivity and loss tangent at variable temperatures . 12
4.3.1 Test conditions . 12
4.3.2 Preparation . 12
4.3.3 Fixture . 12
4.3.4 Connection to VNA . 12
4.3.5 VNA parameter . 12
4.3.6 Temperature in the chamber . 12
4.3.7 Frequency and Q-factor without specimen . 12
4.3.8 Micrometer . 12
4.3.9 Setting of the specimen . 13
4.3.10 Frequency and Q-factor with specimen . 13
4.3.11 Calculation . 13

IEC 61189-2-721:2015 © IEC 2015 – 3 –
4.3.12 Options . 13
4.3.13 Thermal coefficient . 13
4.3.14 Change in test frequency . 14
5 Report . 14
5.1 At room temperature . 14
5.2 At variable temperature . 14
6 Additional information . 14
6.1 Accuracy . 14
6.2 Maintenance . 14
6.3 Matters to be attended . 15
6.4 Additional information concerning fixtures and results . 15
6.5 Additional information on K (ε ,h) and p . 15
ε r es
Annex A (informative) Example of test fixture and test result . 16
A.1 Example of test fixture . 16
A.2 Example of test result . 16
Annex B (informative) Additional information on K (ε ,h) and p . 19
ε r es
Bibliography . 22

Figure 1 – Scheme of SPDR test fixture . 6
Figure 2 – Component diagram of test system . 8
Figure 3 – Scheme of the change of resonance frequency with or without the
specimen . 10
Figure A.1 – Test fixture . 16
Figure A.2 – Relative permittivity versus frequency (laminate of Dk 3,8 and thickness
0,51 mm) . 17
Figure A.3 – Loss tangent versus frequency (laminate of Dk 3,8 and thickness
0,51 mm) . 17
Figure A.4 – Curve of relative permittivity and loss tangent at variable temperatures
(laminate of Dk 3,8 and thickness 0,51 mm) . 18
Figure B.1 – K (ε ,h) versus relative permittivity at different sample thicknesses . 19
ε r
Figure B.2 – Distribution of the electric field of the split dielectric resonator (side view
of the dielectric resonators) . 20
Figure B.3 – Distribution of the electric field of the split dielectric resonator (top view
between the dielectric resonators) . 21
Figure B.4 – p versus relative permittivity at different sample thicknesses . 21
es
Table 1 – Specimen dimensions . 7
Table 2 – SPDR test fixture’s parameter . 9
Table B.1 – Results of measurements of different materials using a 10 GHz SPDR. 20

– 4 – IEC 61189-2-721:2015 © IEC 2015
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND
OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES –

Part 2-721: Test methods for materials for interconnection structures –
Measurement of relative permittivity and loss tangent for copper clad
laminate at microwave frequency using split post dielectric resonator

FOREWORD
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9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61189-2-721 has been prepared by IEC technical committee 91:
Electronics assembly technology.
The text of this standard is based on the following documents:
FDIS Report on voting
91/1246/FDIS 91/1258/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

IEC 61189-2-721:2015 © IEC 2015 – 5 –
A list of all parts in the IEC 61189 series, published under the general title Test methods for
electrical materials, printed boards and other interconnection structures and assemblies, can
be found on the IEC website.
Future standards in this series will carry the new general title as cited above. Titles of existing
standards in this series will be updated at the time of the next edition.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 6 – IEC 61189-2-721:2015 © IEC 2015
TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND
OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES –

Part 2-721: Test methods for materials for interconnection structures –
Measurement of relative permittivity and loss tangent for copper clad
laminate at microwave frequency using split post dielect
...