IEC TR 62899-402-4:2021
(Main)Printed electronics - Part 402-4: Printability - Measurement of qualities - Classification and measurement methods for morphology
Printed electronics - Part 402-4: Printability - Measurement of qualities - Classification and measurement methods for morphology
IEC TR 62899-402-4:2021(E), which is a Technical Report, is a preparatory work for the documents dealing with the measurement method of the vertical direction (surface forms) of printed patterns made by printed electronics technology.
The printed pattern of interest in this document is limited to straight lines on substrates with a flat surface. This document focuses on the classification and measurement methods for surface forms from the nanometer scale to the micrometer scale, and suggests the strategy for the subsequent documents.
General Information
- Status
- Published
- Publication Date
- 20-Sep-2021
- Technical Committee
- TC 119 - Printed Electronics
- Drafting Committee
- WG 4 - TC 119/WG 4
- Current Stage
- PPUB - Publication issued
- Start Date
- 21-Sep-2021
- Completion Date
- 12-Oct-2021
Overview
IEC TR 62899-402-4:2021 is a technical report developed by the International Electrotechnical Commission (IEC) addressing printability in printed electronics, specifically the classification and measurement methods for morphology. The focus is on the vertical direction (surface forms) of printed patterns, with particular attention to straight lines printed on flat substrates. This document explores methods to assess surface morphology from the nanometer to micrometer scale. As a preparatory work, it lays groundwork for future IEC standards on surface roughness, thickness, and profile of printed electronics.
Morphology plays a crucial role in determining the properties and performance of printed electronic patterns, influencing not only electrical functionality but the reliability of advanced manufacturing processes, especially for applications requiring high precision and quality control.
Key Topics
- Classification of Surface Forms
- Differentiates between micro surface roughness (fine features under 5 µm), pattern profile (5 µm to 200 µm), and pattern roughness/waviness (long-range undulations).
- Measurement Methods
- Describes the use of Atomic Force Microscopy (AFM), confocal microscopy, optical profilometers, and stylus-type instruments for analyzing surface features at micro- and nanoscale.
- Discusses methods for quantifying characteristic features such as "side horns" (coffee stain effect), trapezoid, and semi-elliptical cross-sections.
- Parameters for Surface Analysis
- Introduces key parameters including roughness average (Ra), root mean square roughness (Rq), maximum peak-to-valley (Rpv), ten point height (Rz), and the need for comprehensive evaluation beyond conventional roughness metrics.
- Link to Electrical Performance
- Emphasizes the importance of morphology for multilayered structures and printed conductive lines, where variability in surface profile can directly affect conductivity and device function.
Applications
The guidance provided by IEC TR 62899-402-4:2021 is essential for:
- Printed Electronics Manufacturing
Ensuring consistent quality and functional performance in devices such as sensors, displays, RFID tags, and flexible circuits by employing appropriate surface measurement methods. - Quality Assurance and Control
Supporting robust inspection routines for process optimization and defect identification, which is critical for industries adopting roll-to-roll and inkjet printing techniques. - Product Development
Facilitating material and process comparison during R&D by providing a clear classification and measurement methodology for assessing surface morphology. - Standardization Efforts
Serving as a reference for developing additional standards in printed electronics, particularly in defining and harmonizing terminology and approaches for vertical variance and roughness.
Related Standards
- IEC 62899-402 Series
Other parts of the IEC 62899-402 series address pattern width (402-1), edge waviness (402-2), and voids in printed patterns (402-3). Future parts will cover surface roughness, thickness, and profile in more detail. - ISO Surface Roughness Standards
Several ISO standards are referenced for surface texture measurement, including ISO 1302, ISO 3274, ISO 4287, ISO 4288, and ISO 13565 series, laying a foundation for the evaluation of surface qualities in engineering and electronics. - IEC TC 119
This technical committee is responsible for the development of international standards in printed electronics, ensuring global alignment and interoperability.
Practical Value
By establishing a common language and methodology for measuring and classifying the morphology of printed electronic patterns, IEC TR 62899-402-4:2021 supports:
- Improved comparability and reproducibility across laboratories and production sites.
- Enhanced device reliability through better surface control.
- Accelerated adoption of printed electronics technologies in high-performance applications.
Keywords: printed electronics, surface morphology, measurement methods, IEC TR 62899-402-4, surface roughness, AFM, printability, quality assurance, standardization, conductive patterns, pattern profile.
Frequently Asked Questions
IEC TR 62899-402-4:2021 is a technical report published by the International Electrotechnical Commission (IEC). Its full title is "Printed electronics - Part 402-4: Printability - Measurement of qualities - Classification and measurement methods for morphology". This standard covers: IEC TR 62899-402-4:2021(E), which is a Technical Report, is a preparatory work for the documents dealing with the measurement method of the vertical direction (surface forms) of printed patterns made by printed electronics technology. The printed pattern of interest in this document is limited to straight lines on substrates with a flat surface. This document focuses on the classification and measurement methods for surface forms from the nanometer scale to the micrometer scale, and suggests the strategy for the subsequent documents.
IEC TR 62899-402-4:2021(E), which is a Technical Report, is a preparatory work for the documents dealing with the measurement method of the vertical direction (surface forms) of printed patterns made by printed electronics technology. The printed pattern of interest in this document is limited to straight lines on substrates with a flat surface. This document focuses on the classification and measurement methods for surface forms from the nanometer scale to the micrometer scale, and suggests the strategy for the subsequent documents.
IEC TR 62899-402-4:2021 is classified under the following ICS (International Classification for Standards) categories: 31.180 - Printed circuits and boards. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC TR 62899-402-4:2021 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
IEC TR 62899-402-4 ®
Edition 1.0 2021-09
TECHNICAL
REPORT
colour
inside
Printed electronics –
Part 402-4: Printability – Measurement of qualities – Classification and
measurement methods for morphology
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IEC TR 62899-402-4 ®
Edition 1.0 2021-09
TECHNICAL
REPORT
colour
inside
Printed electronics –
Part 402-4: Printability – Measurement of qualities – Classification and
measurement methods for morphology
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.180 ISBN 978-2-8322-1024-7
– 2 – IEC TR 62899-402-4:2021 IEC 2021
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Classification of surface forms for future standardization work . 7
5 ISO documents concerning surface roughness . 8
6 Examples of measurement . 9
6.1 Micro surface roughness of the printed pattern . 9
6.1.1 AFM approach . 9
6.1.2 Shape of the droplet on substrates using inkjet printing . 12
6.2 Thickness of the printed pattern (improved thickness) . 13
6.2.1 Measurement of trapezoid and semi ellipse . 13
6.2.2 Measurement of side horn . 14
6.3 Roughness for the printed conductive line . 14
7 Suggestions for future standardization on morphology . 16
Bibliography . 17
Figure 1 – Typical pattern profile. 6
Figure 2 – Classification of parameters and future standardization work in TC 119 . 7
Figure 3 – Flow of data processing and related standards . 8
Figure 4 – AFM image of NWCNT printed pattern . 9
Figure 5 – Three-dimensional AFM nanoscale surface images and parameters . 10
Figure 6 – Surface image of printed electrode and sensor and grain size distribution
histogram on working surface of SPCE, SPCE-Chi, and SPCE-Chi-GST at 1 μm x 1
μm AFM scan size . 11
Figure 7 – Example of "side horns" . 13
Figure 8 – Electrode formed by gravure offset printing . 14
Figure 9 – An example of roughness in the cross-section in the width direction of a
printed line . 15
Figure 10 – An example of average value of the cross section area . 16
Table 1 – The ISO standards related to the surface roughness . 8
Table 2 – Surface grain structure estimation on a working platform . 10
Table 3 – R-parameters exploration from AFM micrographs at 1 μm x1 μm scan size . 12
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PRINTED ELECTRONICS –
Part 402-4: Printability – Measurement of qualities –
Classification and measurement methods for morphology
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
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preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
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rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC TR 62899-402-4 has been prepared by IEC technical committee 119: Printed Electronics.
It is a Technical Report.
The text of this Technical Report is based on the following documents:
Draft Report on voting
119/300/DTR 119/357/RVDTR
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Report is English.
– 4 – IEC TR 62899-402-4:2021 IEC 2021
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts in the IEC 62899 series, published under the general title Printed electronics,
can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
INTRODUCTION
The IEC 62899-402 series specifies basic measurement methods for printed patterns prepared
using printed electronics technology. An overview of the documents in the IEC 62899-402 series
is given in IEC 62899-401.
Since the surface morphologies of printed patterns strongly affect the electrical properties of
patterns as well as the printing process such as overlay printing onto the patterns, IEC TC 119
plans to prepare other documents to measure the vertical variance of printed patterns, such as
the future IEC 62899-402-5 which deals with “‘surface roughness”, the future IEC 62899-402-6
which deals with “thickness” and the future IEC 62899-402-7 which deals with ”surface profile”’.
These future documents were designed based on assumptions from classical technologies such
as photolithography. However, the cross section of patterns by photolithography has usually a
trapezoidal or rectangular shape, and the surface of the patterns is always flat and smooth. In
contrast, the actual surface of the printed pattern has various morphologies, because the
characteristic surface morphologies are formed by the various printing technologies used in
printed electronics, and factors that cannot be controlled perfectly are included in the process
of forming the surface. Reflecting those features, the range of variance to be measured in the
area of printed electronics becomes very broad, and various measurement methods are used
in those measurements. In order to prepare the subsequent documents, the current
measurement methods should be reviewed in a technical report. This review will clarify the
relation between the morphologies and the appropriate measurement methods.
According to the complicated surface morphologies, it is not easy to specify the measuring point
on the surface. This problem will also be reviewed in this document by organizing the definitions
of morphologies.
– 6 – IEC TR 62899-402-4:2021 IEC 2021
PRINTED ELECTRONICS –
Part 402-4: Printability – Measurement of qualities –
Classification and measurement methods for morphology
1 Scope
This part of IEC 62899-402, which is a Technical Report, is a preparatory work for the
documents dealing with the measurement method of the vertical direction (surface forms) of
printed patterns made by printed electronics technology.
The printed pattern of interest in this document is limited to straight lines on substrates with a
flat surface. This document focuses on the classification and measurement methods for surface
forms from the nanometer scale to the micrometer scale, and suggests the strategy for the
subsequent documents.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
pattern profile
characteristics of the cross sectional form in the width direction
Note 1 to entry: Three shapes, ie trapezoid, arch and side horn are proposed as typical shapes (see Figure 1).
Figure 1 – Typical pattern profile
Note 2 to entry: The side horn shape is called coffee stain in the academic area. However side horn is used in this
document.
3.2
micro surface roughness of the printed pattern
amplitude and short-wavelength (less than 10 µm) component of the surface
3.3
thickness of the printed pattern
improved thickness
maximum distance between the top surface and bottom side in the width direction of the printed
pattern
3.4
pattern roughness in the line direction
variation in thickness in the line direction
4 Classification of surface forms for future standardization work
Surface forms can be classified as shown in Figure 2. "Pattern micro roughness" expresses the
finest unevenness (less than 5 µm) on the surface of the printed lines. "Pattern profile" includes
a larger unevenness (from 5 µm to 200 µm). The area of "Pattern roughness" (or waviness)
overlaps "Pattern profile", but this shows the waviness with a long range frequency and can be
separated from the fine unevenness. "Pattern thickness" can be based on a different concept
than the above three parameters, but it is also added to Figure 2 since it has a deep relation
with these parameters.
Standards on the measurements for the vertical direction can be prepared according to this
classification.
Figure 2 – Classification of parameters and future standardization work in TC 119
– 8 – IEC TR 62899-402-4:2021 IEC 2021
5 ISO documents concerning surface roughness
ISO/TC 213 (Dimensional and geometrical product specifications and verification) is a TC that
handles product dimensions and tolerances. Since the surface roughness is one of the factors
that affects them, ISO/TC 213 has prepared many standards related to the surface roughness
such as data processing, definitions of terms (see Figure 3). However, it is not possible to find
a document for the measurement method that can be directly used in the printed electronics
industry. The summary of the ISO standards is listed in Table 1.
Figure 3 – Flow of data processing and related standards
Table 1 – The ISO standards related to the surface roughness
Document No Title Brief summary
ISO 1302 [8] Geometrical Product Specifications This d
...




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