PT 61000-4-33 - TC 77/SC 77C/PT 61000-4-33
TC 77/SC 77C/PT 61000-4-33
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PT 61000-4-33 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 77/SC 77C/PT 61000-4-33". This committee has published 1 standards.
PT 61000-4-33 develops IEC standards in the area of Information technology. Currently, there are 1 published standards from this technical committee.
The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.
A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.
Provides a basic description of the methods and means (e.g., instrumentation) for measuring responses arising from high-power transient electromagnetic parameters. These responses can include: - the electric (E) and/or magnetic (H) fields (e.g., incident fields or incident plus scattered fields within a system under test); - the current I (e.g., induced by a transient field or within a system under test); - the voltage V (e.g., induced by a transient field or within a system under test); - the charge Q induced on a cable or other conductor. These measured quantities are generally complicated time-dependent waveforms, which can be described approximately by several scalar parameters, or "observables". These parameters include: - the peak amplitude of the response, - the waveform rise-time, - the pulse width, and - mathematically defined norms obtained from the waveform. This International Standard provides information on the measurement of these waveforms and on the mathematical determination of the characterizing parameters. It does not provide information on specific level requirements for testing. It has the status of a basic EMC publication in accordance with IEC Guide 107.
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