Aluminium oxide primarily used for production of aluminium — Determination of trace elements — Wavelength dispersive X-ray fluorescence spectrometric method

ISO 23201:2015 sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These elements are expressed as the oxides Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3, K2O, CuO, Cr2O3, and NiO on an un-dried sample basis. The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is also given.

Oxyde d'aluminium utilisé pour la production d'aluminium — Détermination d'éléments traces — Spectrométrie de fluorescence des rayons X par dispersion en longueur d'onde

General Information

Status
Published
Publication Date
15-Nov-2015
Current Stage
9093 - International Standard confirmed
Start Date
24-Oct-2022
Completion Date
19-Apr-2025
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Standard
ISO 23201:2015 - Aluminium oxide primarily used for production of aluminium -- Determination of trace elements -- Wavelength dispersive X-ray fluorescence spectrometric method
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ISO 23201:2015 - Aluminium oxide primarily used for production of aluminium -- Determination of trace elements -- Wavelength dispersive X-ray fluorescence spectrometric method
English language
32 pages
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Standards Content (Sample)


DRAFT INTERNATIONAL STANDARD ISO/DIS 23201
ISO/TC 226 Secretariat: SN
Voting begins on Voting terminates on

2013-04-08 2013-07-08
INTERNATIONAL ORGANIZATION FOR STANDARDIZATION  •  МЕЖДУНАРОДНАЯ ОРГАНИЗАЦИЯ ПО СТАНДАРТИЗАЦИИ  •  ORGANISATION INTERNATIONALE DE NORMALISATION

Aluminium oxide primarily used for production of aluminium —
Determination of trace elements — Wavelength dispersive X-ray
fluorescence spectrometric method
Oxyde d'aluminium utilisé pour la production d'aluminium — Détermination d'éléments traces — Spectrométrie
de fluorescence des rayons X par dispersion en longueur d'onde

ICS 71.100.10
To expedite distribution, this document is circulated as received from the committee
secretariat. ISO Central Secretariat work of editing and text composition will be undertaken at
publication stage.
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secrétariat du comité. Le travail de rédaction et de composition de texte sera effectué au
Secrétariat central de l'ISO au stade de publication.

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©  International Organization for Standardization, 2013

ISO/DIS 23201
©  ISO 2013
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any
means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission.
Permission can be requested from either ISO at the address below or ISO’s member body in the country of the requester.
ISO copyright office
Case postale 56 • CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail copyright@iso.org
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Published in Switzerland
ii © ISO 2013 – All rights reserved

ISO/DIS 23201
Contents Page
Foreword . iv
Introduction . iv
1 Scope . 1
2 Normative references . 1
3 Principle. 2
4 Reagents and materials . 2
5 Apparatus . 3

ISO/DIS 23201
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 23201 was prepared by Technical Committee ISO/TC 226, Materials for the production of primary
aluminium.
iv © ISO 2013 – All rights reserved

ISO/DIS 23201
Introduction
This Standard is based on Australian Standard AS 2879.7–1997 “Determination of trace elements–
Wavelength dispersive X-ray fluorescence spectrometric method” prepared by the Standards Australia
Committee on Alumina and Materials used in Aluminium Production, to provide an XRF method for the
analysis of alumina.
The objective of this Standard is to provide those responsible for the analysis of smelting-grade alumina with a
standardised, validated procedure that will ensure the integrity of the analysis.
DRAFT INTERNATIONAL STANDARD ISO/DIS 23201

Aluminium oxide primarily used for production of aluminium —
Determination of trace elements — Wavelength dispersive X-ray
fluorescence spectrometric method
1 Scope
This Standard sets out a wavelength dispersive X ray fluorescence spectrometric method for the analysis of
aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium,
titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These
elements are expressed as the oxides Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3,
K2O, CuO, Cr2O3 and NiO on an un-dried sample basis.
The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the
components is given in Table 1.
Table 1 — Applicable concentration range
Concentration range
Component
%
Na O 0,10 to 1,00
SiO 0,005 to 0,05
Fe O 0,005 to 0,05
2 3
CaO 0,01 to 0,10
TiO 0,001 to 0,010
P O 0,001 to 0,050
2 5
V O 0,001 to 0,010
2 5
ZnO 0,001 to 0,010
MnO 0,001 to 0,010
Ga2O3 0,001 to 0,020
K2O 0,001 to 0,010
CuO 0,001 to 0,010
Cr2O3 0,001 to 0,010
NiO 0,001 to 0,010
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the reference
...


INTERNATIONAL ISO
STANDARD 23201
First edition
2015-11-15
Aluminium oxide primarily used
for production of aluminium —
Determination of trace elements
— Wavelength dispersive X-ray
fluorescence spectrometric method
Oxyde d’aluminium utilisé pour la production d’aluminium —
Détermination d’éléments traces — Spectrométrie de fluorescence des
rayons X par dispersion en longueur d’onde
Reference number
©
ISO 2015
© ISO 2015, Published in Switzerland
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
copyright@iso.org
www.iso.org
ii © ISO 2015 – All rights reserved

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Principle . 2
4 Reagents and materials . 2
5 Apparatus . 3
6 Sampling and samples . 5
7 Procedure. 5
7.1 General . 5
7.2 Preparation of calibration specimens . 6
7.2.1 Determination of loss of mass on fusion of flux and flux correction . 6
7.2.2 Preparation of intermediate calibration glass (ICG) . 6
7.2.3 Preparation of the synthetic calibration disk (SCD) . 7
7.2.4 Preparation of the blank calibration discs . 9
7.3 Preparation of the sample discs . 9
7.4 X-ray fluorescence measurement .10
7.4.1 General instrumental conditions .10
7.4.2 Guidelines for instrument optimization .11
7.4.3 Sample loading .11
7.4.4 Monitor disc: correction for instrumental drift .11
7.4.5 Measurements for calibration .12
7.4.6 Measurement of test discs .13
8 Calculations.13
8.1 Calculation of net intensity .13
8.2 Comparison of duplicate measurements for the Al O blanks and Synthetic
2 3
Calibration Discs (SCDs) .14
8.2.1 SCDs criteria for the acceptability of duplicate measurements .14
8.2.2 Al O blanks criteria for the acceptability of duplicate measurement .14
2 3
8.3 Drift correction of measured intensities.15
8.4 Calculation of the calibration parameters .15
9 Consistency checks and reporting results .16
10 Precision .16
11 Accuracy .17
12 Quality assurance and control.17
13 Test report .17
Annex A (informative) Contamination issues and care of platinum ware .19
Annex B (normative) Example of instrument optimization .21
Annex C (informative) Calculation of reagent masses for different sample/flux
combinations and synthetic calibration discs when omitting some elements .25
Annex D (informative) Preparation of monitor disc .27
Annex E (informative) Interlaboratory test program analysis of NIST 699 and ASCRM 27
smelter grade alumina, certified reference materials .29
Annex F (informative) Comments on flux purity .31
Bibliography .32
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical
Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information
The committee responsible for this document is ISO/TC 226, Materials for the production of primary
aluminium.
iv © ISO 2015 – All rights reserved

Introduction
This International Standard is based on Australian Standard AS 2879.7–1997, Alumina — Determination
of trace elements — Wavelength dispersive X-ray fluorescence spectrometric method, developed by the
Standards Australia Committee on Alumina and Materials used in Aluminium Production to provide an
XRF method for the analysis of alumina.
The objective of this International Standard is to provide those responsible for the analysis of smelting-
grade alumina with a standardized, validated procedure that will ensure the integrity of the analysis.
INTERNATIONAL STANDARD ISO 23201:2015(E)
Aluminium oxide primarily used for production of
aluminium — Determination of trace elements —
Wavelength dispersive X-ray fluorescence spectrometric
method
1 Scope
This International Standard sets out a wavelength dispersive X-ray fluorescence spectrometric method
for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium,
silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper,
chromium and nickel. These elements are expressed as the oxides Na O, SiO , Fe O , CaO, TiO , P O ,
2 2 2 3 2 2 5
V O , ZnO, MnO, Ga O , K O, CuO, Cr O and NiO on an un-dried sample basis.
2 5 2 3 2 2 3,
The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each
of the components is given in Table 1.
Table 1 — Applicable concentration range
Concentration range
Component
%
Na O 0,10 to 1,00
SiO 0,003 to 0,05
Fe O 0,003 to 0,05
2 3
CaO 0,003 to 0,10
TiO 0,000 5 to 0,010
P O 0,000 5 to 0,050
2 5
V O 0,000 5 to 0,010
2 5
ZnO 0,000 5 to 0,010
MnO 0,000 5 to 0,010
Ga O 0,000 5 to 0,020
2 3
K2O 0,000 5 to 0,010
CuO 0,000 5 to 0,010
Cr O 0,000 5 to 0,010
2 3
NiO 0,000 5 to 0,010
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
AS 2563, Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
AS 2706, Numeric values — Rounding and interpretation of limiting values
AS 4538.1-1999 (R2013), Guide to the sampling of alumina — Sampling procedures
AS 4538.2-2000 (R2013), Guide to the sampling of alumina — Preparation of samples
3 Principle
A portion of the aluminium oxide test sample is incorporated, via fusion, into a borate glass disc using a
casting technique. X-ray fluorescence measurements are made on this disc.
Calibration is carried out using synthetic standards prepared from pure chemicals using a two-point
regression. Matrix corrections may be employed but, because of the low levels at which the analytes are
present in the Al O matrix, will have negligible effect within the scope of the method.
2 3
Intensity measurements are corrected for spectrometer drift.
A certified reference material, (see Annex E) is used to verify the calibration.
4 Reagents and materials
4.1 Flux, mixture of 12 parts lithium tetraborate to 22 parts lithium metaborate, pre-fused.
This flux is available commercially. Flux will absorb atmospheric moisture when exposed to air.
Minimize water uptake by storing flux in an airtight container.
See Annex F for comments on flux purity.
4.2 Aluminium oxide (Al O ), high purity, nominally 99,999 % Al O .
2 3 2 3
Prepared by heating to 1
...

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