ISO 7870-9:2020
(Main)Control charts — Part 9: Control charts for stationary processes
Control charts — Part 9: Control charts for stationary processes
This document describes the construction and applications of control charts for stationary processes.
Cartes de contrôle — Partie 9: Cartes de contrôle de processus stationnaires
General Information
Standards Content (Sample)
INTERNATIONAL ISO
STANDARD 7870-9
First edition
2020-06
Control charts —
Part 9:
Control charts for stationary
processes
Cartes de contrôle —
Partie 9: Cartes de contrôle de processus stationnaires
Reference number
©
ISO 2020
© ISO 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions, and abbreviated terms and symbols . 1
3.1 Terms and definitions . 1
3.2 Abbreviated terms and symbols . 2
3.2.1 Abbreviated terms . 2
3.2.2 Symbols . 2
4 Control charts for autocorrelated processes for monitoring process mean .3
4.1 General . 3
4.2 Residual charts . 3
4.3 Traditional control charts with adjusted control limits . 6
4.3.1 Modified EWMA chart . 6
4.3.2 Modified CUSUM chart . 8
4.4 Comparisons among charts for autocorrelated data . 8
5 Monitoring process variability for stationary processes . 9
6 Other approaches to deal with process autocorrelation .11
Annex A (informative) Stochastic process and time series .12
Annex B (informative) Performance of traditional control charts for autocorrelated data .15
Bibliography .20
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www .iso .org/
iso/ foreword .html.
This document was prepared by Technical Committee ISO/TC 69, Applications of statistical methods,
Subcommittee SC 4, Applications of statistical methods in product and process management.
A list of all parts in the ISO 7870 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2020 – All rights reserved
Introduction
Statistical process control (SPC) techniques are widely used in industry for process monitoring and
quality improvement. Various statistical control charts have been developed to monitor the process
mean and variability. Traditional SPC methodology is based on a fundamental assumption that process
data are statistically independent. Process data, however, are not always statistically independent from
each other. In the industry for continuous productions such as the chemical industry, most process data
on quality characteristics are self-correlated over time or autocorrelated. In general, autocorrelation
can be caused by the measurement system, the dynamics of the process, or both. In many cases, the
data can exhibit a drifting behaviour. In biology, random biological variation, for example the random
burst in the secretion of some substance that influences the blood pressure, can have a sustained effect
so that several consecutive measurements are all influenced by the same random phenomenon. In data
collection, when the sampling interval is short, autocorrelation, especially the positive autocorrelation
of the data, is a concern. Under such conditions, traditional SPC procedures are not effective and
appropriate for monitoring, controlling and improving process quality.
Autocorrelated processes can be classified in two kinds of processes, based on whether they are
stationary or nonstationary.
1) Stationary process – a direct extension of an independent and identically distributed (i.i.d.)
sequence. An autocorrelated process is stationary if it is in a state of “statistical equilibrium”. This
implies that the basic behaviour of the process does not change in time. In particular, a stationary
process has identical means and variances.
2) Nonstationary process.
Detailed information about stochastic process and time series can be found in Annex A.
To accommodate autocorrelated data, some SPC methodologies have been developed. Mainly, there are
two approaches. The first approach is to use a process residual chart after fitting a time series model or
other mathematical model to the data. Another more direct approach is to modify the existing charts,
for example by adjusting the control limits based on process autocorrelation.
The aim of this document is to outline the major process control charts for monitoring both of the
process mean and the process variance when the process is autocorrelated.
INTERNATIONAL STANDARD ISO 7870-9:2020(E)
Control charts —
Part 9:
Control charts for stationary processes
1 Scope
This document describes the construction and applications of control charts for stationary processes.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 3534-2, Statistics — Vocabulary and symbols — Part 2: Applied statistics
3 Terms and definitions, and abbreviated terms and symbols
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 3534-2 and the following apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1.1
autocovariance
internal covariance between members of series of observations ordered in time
3.1.2
control charts for autocorrelated processes
statistical process control charts applied to autocorrelated processes
3.2 Abbreviated terms and symbols
3.2.1 Abbreviated terms
ARL average run length
i.i.d. independent and identically distributed
SPC statistical process control
ACF autocorrelation function
AR(1) first order autoregressive process
EWMA exponentially weighted moving average
EWMAST exponentially weighted moving average for a stationary process
EWMS exponentially weighted mean squared deviation
CUSUM cumulative sum
3.2.2 Symbols
T index set for a stochastic process
μ true process mean
σ true process standard deviation
2 2
normal distribution with a mean of μ and variance of σ
N μσ,
()
γ autocovariance
ˆ estimator of autocovariance
γ
ρ autocorrelation
estimator of autocorrelation
ρˆ
ϕ dependent parameter of an AR(1) process
λ smoothing parameter for EWMA
r smoothing parameter for EWMS
τ time lag between two time points
S EWMS at t
t
2 2
S initial value of S
0 t
X random variable X at t
t
a random variable a at t in an AR(1) process
t
Δ step mean change as a multiple of the process standard deviation
arithmetic mean value of a sequence of x
x
s standard deviation of a sequence of x
ˆ prediction of X
X t
t
R residual at t
t
arithmetic mean value of R
R
t
S standard deviation of {R }
R t
Z EWMA statistic at t
t
Z initial value of Z
0 t
L value of the control limit for Z (expresses in number of standard deviation of Z )
Z t t
2 © ISO 2020 – All rights reserved
σ standard deviation of EWMA statistic
Z
σ standard deviation of the random variables a from white noise in an AR(1) process
a t
4 Control charts for autocorrelated processes for monitoring process mean
4.1 General
Many statisticians and statistical process control practitioners have found that autocorrelation in
process data has an impact on the performance of the traditional SPC charts. Similar to autocovariance
(see 3.1.1), autocorrelation is internal correlation between members of a series of observations ordered
in time. Autocorrelation can be caused by the measurement system, the dynamics of the process, or
both. In Annex B, the impact of positive autocorrelation on the performance of various traditional
control charts is demonstrated.
4.2 Residual charts
The residual charts have been used to monitor possible changes of the process mean. To construct a
residual chart, time series or other mathematical modelling has to be applied to the process data.
[1]
The residual chart requires modelling the process data and to obtain the process residuals . For a set
of time series data, xt;,=12,.,N , a time series or other mathematical model is established to fit the
{}
t
data. A residual at t is defined as:
ˆ
Rx=−x
tt t
where xˆ is the prediction of the time series at t based on a time series or other mathematical model.
t
Assuming that the model is true, the residuals are statistically uncorrelated to each other. Then,
traditional SPC charts such as X charts, CUSUM charts and EWMA charts can be applied to the residuals.
When an X chart is applied to the residuals, it is usually called an X residual chart. Once a change of the
mean in the residual process is detected, it is concluded that the mean of the process itself has been out-
of-control.
[2][3]
Similarly, the CUSUM residual chart and EWMA residual chart are proposed . See Reference [4] for
comparisons between residual charts and other control charts.
Advantage of the residual charts:
— a residual chart can be applied to any autocorrelated data, even if it is nonstationary. Usually, a
mode
...
INTERNATIONAL ISO
STANDARD 7870-9
First edition
2020-06
Control charts —
Part 9:
Control charts for stationary
processes
Cartes de contrôle —
Partie 9: Cartes de contrôle de processus stationnaires
Reference number
©
ISO 2020
© ISO 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions, and abbreviated terms and symbols . 1
3.1 Terms and definitions . 1
3.2 Abbreviated terms and symbols . 2
3.2.1 Abbreviated terms . 2
3.2.2 Symbols . 2
4 Control charts for autocorrelated processes for monitoring process mean .3
4.1 General . 3
4.2 Residual charts . 3
4.3 Traditional control charts with adjusted control limits . 6
4.3.1 Modified EWMA chart . 6
4.3.2 Modified CUSUM chart . 8
4.4 Comparisons among charts for autocorrelated data . 8
5 Monitoring process variability for stationary processes . 9
6 Other approaches to deal with process autocorrelation .11
Annex A (informative) Stochastic process and time series .12
Annex B (informative) Performance of traditional control charts for autocorrelated data .15
Bibliography .20
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www .iso .org/
iso/ foreword .html.
This document was prepared by Technical Committee ISO/TC 69, Applications of statistical methods,
Subcommittee SC 4, Applications of statistical methods in product and process management.
A list of all parts in the ISO 7870 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2020 – All rights reserved
Introduction
Statistical process control (SPC) techniques are widely used in industry for process monitoring and
quality improvement. Various statistical control charts have been developed to monitor the process
mean and variability. Traditional SPC methodology is based on a fundamental assumption that process
data are statistically independent. Process data, however, are not always statistically independent from
each other. In the industry for continuous productions such as the chemical industry, most process data
on quality characteristics are self-correlated over time or autocorrelated. In general, autocorrelation
can be caused by the measurement system, the dynamics of the process, or both. In many cases, the
data can exhibit a drifting behaviour. In biology, random biological variation, for example the random
burst in the secretion of some substance that influences the blood pressure, can have a sustained effect
so that several consecutive measurements are all influenced by the same random phenomenon. In data
collection, when the sampling interval is short, autocorrelation, especially the positive autocorrelation
of the data, is a concern. Under such conditions, traditional SPC procedures are not effective and
appropriate for monitoring, controlling and improving process quality.
Autocorrelated processes can be classified in two kinds of processes, based on whether they are
stationary or nonstationary.
1) Stationary process – a direct extension of an independent and identically distributed (i.i.d.)
sequence. An autocorrelated process is stationary if it is in a state of “statistical equilibrium”. This
implies that the basic behaviour of the process does not change in time. In particular, a stationary
process has identical means and variances.
2) Nonstationary process.
Detailed information about stochastic process and time series can be found in Annex A.
To accommodate autocorrelated data, some SPC methodologies have been developed. Mainly, there are
two approaches. The first approach is to use a process residual chart after fitting a time series model or
other mathematical model to the data. Another more direct approach is to modify the existing charts,
for example by adjusting the control limits based on process autocorrelation.
The aim of this document is to outline the major process control charts for monitoring both of the
process mean and the process variance when the process is autocorrelated.
INTERNATIONAL STANDARD ISO 7870-9:2020(E)
Control charts —
Part 9:
Control charts for stationary processes
1 Scope
This document describes the construction and applications of control charts for stationary processes.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 3534-2, Statistics — Vocabulary and symbols — Part 2: Applied statistics
3 Terms and definitions, and abbreviated terms and symbols
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 3534-2 and the following apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1.1
autocovariance
internal covariance between members of series of observations ordered in time
3.1.2
control charts for autocorrelated processes
statistical process control charts applied to autocorrelated processes
3.2 Abbreviated terms and symbols
3.2.1 Abbreviated terms
ARL average run length
i.i.d. independent and identically distributed
SPC statistical process control
ACF autocorrelation function
AR(1) first order autoregressive process
EWMA exponentially weighted moving average
EWMAST exponentially weighted moving average for a stationary process
EWMS exponentially weighted mean squared deviation
CUSUM cumulative sum
3.2.2 Symbols
T index set for a stochastic process
μ true process mean
σ true process standard deviation
2 2
normal distribution with a mean of μ and variance of σ
N μσ,
()
γ autocovariance
ˆ estimator of autocovariance
γ
ρ autocorrelation
estimator of autocorrelation
ρˆ
ϕ dependent parameter of an AR(1) process
λ smoothing parameter for EWMA
r smoothing parameter for EWMS
τ time lag between two time points
S EWMS at t
t
2 2
S initial value of S
0 t
X random variable X at t
t
a random variable a at t in an AR(1) process
t
Δ step mean change as a multiple of the process standard deviation
arithmetic mean value of a sequence of x
x
s standard deviation of a sequence of x
ˆ prediction of X
X t
t
R residual at t
t
arithmetic mean value of R
R
t
S standard deviation of {R }
R t
Z EWMA statistic at t
t
Z initial value of Z
0 t
L value of the control limit for Z (expresses in number of standard deviation of Z )
Z t t
2 © ISO 2020 – All rights reserved
σ standard deviation of EWMA statistic
Z
σ standard deviation of the random variables a from white noise in an AR(1) process
a t
4 Control charts for autocorrelated processes for monitoring process mean
4.1 General
Many statisticians and statistical process control practitioners have found that autocorrelation in
process data has an impact on the performance of the traditional SPC charts. Similar to autocovariance
(see 3.1.1), autocorrelation is internal correlation between members of a series of observations ordered
in time. Autocorrelation can be caused by the measurement system, the dynamics of the process, or
both. In Annex B, the impact of positive autocorrelation on the performance of various traditional
control charts is demonstrated.
4.2 Residual charts
The residual charts have been used to monitor possible changes of the process mean. To construct a
residual chart, time series or other mathematical modelling has to be applied to the process data.
[1]
The residual chart requires modelling the process data and to obtain the process residuals . For a set
of time series data, xt;,=12,.,N , a time series or other mathematical model is established to fit the
{}
t
data. A residual at t is defined as:
ˆ
Rx=−x
tt t
where xˆ is the prediction of the time series at t based on a time series or other mathematical model.
t
Assuming that the model is true, the residuals are statistically uncorrelated to each other. Then,
traditional SPC charts such as X charts, CUSUM charts and EWMA charts can be applied to the residuals.
When an X chart is applied to the residuals, it is usually called an X residual chart. Once a change of the
mean in the residual process is detected, it is concluded that the mean of the process itself has been out-
of-control.
[2][3]
Similarly, the CUSUM residual chart and EWMA residual chart are proposed . See Reference [4] for
comparisons between residual charts and other control charts.
Advantage of the residual charts:
— a residual chart can be applied to any autocorrelated data, even if it is nonstationary. Usually, a
mode
...
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