IEC 62146-1:2013/AMD1:2016

IEC 62146-1 ®
Edition 1.0 2016-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AM ENDMENT 1
AM ENDEMENT 1
Grading capacitors for high-voltage alternating current circuit-breakers –
Part 1: General
Condensateurs de répartition pour disjoncteurs à courant alternatif haute
tension –
Partie 1: Généralités
IEC 62146-1:2013-09/AMD1:2016-06(en-fr)

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IEC 62146-1 ®
Edition 1.0 2016-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AM ENDMENT 1
AM ENDEMENT 1
Grading capacitors for high-voltage alternating current circuit-breakers –

Part 1: General
Condensateurs de répartition pour disjoncteurs à courant alternatif haute

tension –
Partie 1: Généralités
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.060.01; 31.060.70 ISBN 978-2-8322-3476-1

– 2 – IEC 62146-1:2013/AMD1:2016
© IEC 2016
FOREWORD
This amendment has been prepared by IEC technical committee 33: Power capacitors and
their applications.
The text of this amendment is based on the following documents:
FDIS Report on voting
33/583/FDIS 33/586/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
1 Scope
Add, after the last dashed point of Clause 1, the following new note and paragraph:
NOTE CIGRE Technical Brochure 368 [2] presents a study about the operating environment of voltage grading
capacitors applied to high-voltage circuit-breakers.
This standard does not apply to phase-to-earth capacitors installed on the circuit-breaker to
modify the Transient Recovery Voltage.
7.4 Minimum withstand value of mechanical bending load
Replace existing Subclause 7.4 by the following new text:
7.4.1 Capacitors mounted on air insulated circuit -breaker
The test bending moment M shall be calculated as follows:
c
m 1
 
M = 100+ ×g× ×l
 
C
2 0,7
 
where
M is in Nm;
c
l is the length of the capacitor in m;

© IEC 2016
m is the mass of the capacitor in kg;
g is the gravitational acceleration 9,81 m/s .
NOTE The factor 0,7 comes from figure 1 of IEC 62155 (relation between type test and routine test value).
M shall have a minimum value of 2 500 Nm.
c
7.4.2 Immersed capacitors
The test bending moment M shall be calculated as follows:
c
m 1
M = ×g× ×l
C
2 0,7
8.1 Information for identification of specimens
Replace the first paragraph of Subclause 8.1 by the following new text:
The manufacturer shall submit to the testing laboratory, drawings and other data containing
sufficient information to unambiguously identify the type with essential details and parts of the
capacitor presented for test, containing at least the following information:
8.4.1 General
Replace the first paragraph of Subclause 8.4.1 by the following new text:
The objective of the dielectric tests is to test the withstand capability of the internal part of the
capacitor. It is assumed that the wet tests are performed with the grading capacitor mounted
on the circuit-breaker as part of the circuit-breaker type tests. For that reason, the wet tests
can be omitted for the grading capacitor alone.
8.4.2 Capacitance measurement at power frequency
Replace the third paragraph of Subclause 8.4.2 by the following new text:
The initial and final capacitance measurement shall be carried out at a voltage between 1 and
1,2 times the voltage U before and after the voltage tests (see 8.4.7).
cr
8.4.7 Power frequency voltage test
Replace the third paragraph of Subclause 8.4.7 by the following new text:
The capacitor has passed the test if:
– no flashover occurs external to the grading capacitor,
– no internal breakdown occurs, which shall be verified by a measurement of the
capacitance, tanδ and partial discharges of the units before and after the test (see 8.4.2,
8.4.3 and 8.4.4).
8.5 Voltage test at low and high temperature
Replace the first paragraph of Subclause 8.5 by the following new text:
The test can be carried out on a sample or a full size capacitor. The dielectric routine tests
(see Figure 2) shall be carried out before the test.
Replace the fourth paragraph of Subclause 8.5 by the following new text:

– 4 – IEC 62146-1:2013/AMD1:2016
© IEC 2016
After these tests, the capacitor shall pass the dielectric routine tests (see Figure 2) at ambient
temperature.
8.8 Mechanical bending test
Replace the second paragraph of Subclause 8.8 by the following new text and note:
The value of the test force F is calculated from the bending moment M defined in 7.4.
c c
NOTE In case of completely axis symmetrical construction, the bending test needs to be performed in one
direction only.
9.6.2.2 Immersed capacitors
Replace existing Subclause 9.6.2.2 by the following new text:
The capacitor shall be placed in an enclosure at the maximum ambient temperature,
according to the temperature range; the following program has to be applied:
• the ambient pressure in the enclosure is reduced until max 10 Pa (abs) during 12 h;
• the ambient pressure in the enclosure is increased up to 0,7 MPa (abs) during 18 h; in
case of an intended application in a circuit breaker with a higher service pressure than
0,7 MPa (abs), a type test shall be performed, with an ambient pressure in the enclosure
increased accordingly;
• the ambient pressure in the enclosure is reduced to a value between 100 Pa (abs) and
500 Pa (abs) during 6 h.
The tightness of the capacitor shall be checked when it is removed from the enclosure and
48 h later.
The capacitor shall be considered to have passed the test if there is n
...