IEC 60747-18-5:2023

IEC 60747-18-5 ®
Edition 1.0 2023-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 18-5: Semiconductor bio sensors – Evaluation method for light responsivity
characteristics of lens-free CMOS photonic array sensor package modules by
incident angle of light
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IEC 60747-18-5 ®
Edition 1.0 2023-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 18-5: Semiconductor bio sensors – Evaluation method for light

responsivity characteristics of lens-free CMOS photonic array sensor package

modules by incident angle of light

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-6644-1

– 2 – IEC 60747-18-5:2023 © IEC 2023
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Measurement setup . 7
4.1 General . 7
4.2 Measurement system . 7
5 Measurement. 7
5.1 General . 7
5.2 Case 1: Spectral responsivity with various incident light angles . 8
5.2.1 General . 8
5.2.2 Step 1: Measure dark offset . 8
5.2.3 Step 2: Status check of monochromatic light source within test spectral
range . 8
5.2.4 Step 3: Measure responsivity to varying wavelengths of input light on
optical axis . 8
5.2.5 Step 4: Measure responsivity to varying wavelengths of input light off
optical axis . 8
5.2.6 Step 5: Measured data processing . 9
6 Test report . 10
Annex A (informative) Test report . 11
Bibliography . 12

Figure 1 – Measurement workflow. 7
Figure 2 – Example of angular response measurement . 8
Figure 3 – n trial data of frame capture . 9
Figure 4 – Data processing for illuminated response . 9

Table A.1 – Test environment specifications of CMOS photonic array sensors . 11

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 18-5: Semiconductor bio sensors – Evaluation method for light
responsivity characteristics of lens-free CMOS photonic array sensor
package modules by incident angle of light

FOREWORD
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IEC 60747-18-5 has been prepared by subcommittee 47E: Discrete semiconductor devices, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47E/779/CDV 47E/791/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

– 4 – IEC 60747-18-5:2023 © IEC 2023
This document was drafted in accordance with ISO/IEC Dir
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