EN 61143-2:1994

SLOVENSKI STANDARD
01-julij-1999
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Electrical measuring instruments - X-t recorders -- Part 2: Recommended additional test
methods
Elektrische Meßgeräte - X-t-Schreiber -- Teil 2: Empfohlene zusätzliche Prüfverfahren
Appareils électriques de mesure - Enregistreurs X-t -- Partie 2: Méthodes d'essais
complémentaires recommandées
Ta slovenski standard je istoveten z: EN 61143-2:1994
ICS:
17.220.20 0HUMHQMHHOHNWULþQLKLQ Measurement of electrical
PDJQHWQLKYHOLþLQ and magnetic quantities
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME CEI
INTERNATIONALE IEC
61143-2
INTERNATIONAL
Première édition
STANDARD
First edition
1992-11
Appareils électriques de mesure –
Enregistreurs X-t
Partie 2:
Méthodes d'essais complémentaires
recommandées
Electrical measuring instruments –
X-t recorders
Part 2:
Recommended additional test methods
© !EC 1992 Droits de reproduction réservés — Copyright - all rights reserved
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Pour prix, voir catalogue en vigueur
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1143-2©IEC — 3 —
CONTENTS
Page
FOREWORD 5
INTRODUCTION 7
Clause
1.1 Scope 9
2.11 Intrinsic error test 9
2.12 Additional error due to zero displacement 11
2.13 Mutual influence of different measuring circuits of multiple and multiple channel
recorders 13
4.20 Determination of the value of the dead band 13
6 Influence of parasitic quantities 15
6.1 Common mode interference 15
6.2 Series (parallel) mode interference 15
7 Test of dynamic pe rformance 15
7.1 Response time 15
7.2 Frequency response range 17
7.3 Overshoot 17
1143-2©IEC – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
ELECTRICAL MEASURING INSTRUMENTS –
X-t RECORDERS
Part 2: Recommended additional test methods
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization
comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to
promote international cooperation on all questions concerning standardization in the electrical and
electronic fields. To this end and in addition to other activities, the IEC publishes International Standards.
Their preparation is entrusted to technical committees; any IEC National Committee interested in
the subject dealt with may participate in this preparatory work. International, governmental and
non-governmental organizations liaising with the IEC also participate in this preparation. The IEC
collaborates closely with the International Organization for Standardization (ISO) in accordance with
conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of the IEC on technical matters, prepared by technical committees on
which all the National Committees having a special interest therein are represented, express, as nearly as
possible, an international consensus of opinion on the subjects dealt with.
3) They have the form of recommendations for international use published in the form of standards, technical
reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
This part of International Standard IEC 1143 has been prepared by IEC technical
committee 85: Measuring equipment for basic electrical quantities.
The IEC 1143-1 and IEC 1143-2 cancel and replace the IEC 484 (1974).
The text of this standard is based on the following documents:
DIS
Report on Voting
85(CO)18
85(CO)21
Full information on the voting for the approval of this standard can be found in the repo rt
on voting indicated in the above table.

1143-2©IEC – 7 --
INTRODUCTION
This part of IEC 1143 shall be read in conjunction with part 1 and IEC 51-9: 1988, Direct
acting indicating analogue electrical measuring instruments and their accessories – Pa
rt 9:
Recommended test methods.
It gives details of tests which are specific to X-t recorders. The testing conditions and the
more conventional tests, which shall be followed, are those given in the following list of
subclauses from IEC 51-9:
1.2
3.5.2
1.2.8 3.6
1.2.9
3.7
1.2.11 3.8
1.2.12
3.17
1.2.13
3.18
3.2 4.1
3.4 4.6
3.5
4.10
3.5.2 4.19
3.6
Other clauses from IEC 51-9 may also be applied, if relevant.
For easier reference clause numbering follows that of IEC 51-9.
For X-t recorders, tapping is not allowed.
In case of doubt, the text of this part 2 as well as that of pa
rt 1 shall prevail.
1143-2©IEC - 9 -
ELECTRICAL MEASURING INSTRUMENTS –
X-t RECORDERS
Part 2: Recommended additional test methods
1.1 Scope
See part 1.
2.11 Intrinsic error test
The recorder shall be under reference conditions with the auxiliary circuits energized.
2.11.1 Measuring circuit
Before determining the intrinsic error, the record shall be at the chart scale line
corresponding to zero and the chart driving mechanism shall be on.
The errors shall be determined for both increasing and decreasing values of the
measurand as follows:
2.11.1.1 Continuous line recorders and single channel dotted line recorders
Procedure:
An input quantity shall be applied and increased sufficiently slowly, in order to avoid
BX,
overshoot, to a value corresponding to the input quantity, Ba. The recorded value,
shall be read as soon as the steady state value of the input has been reached and the
chart has advanced by at least 2 mm.
This test shall be performed at five approximately equal steps within the span, including
the lower and upper limits of the measuring range.
For single channel dotted line recorders, the reading used shall be that of the dot next
following the one indicating that the steady state has been reached. During this test the
chart shall be driven at a sufficiently high speed for the individual dots to be
distinguishable.
Computation:
The intrinsic error, expressed as a percentage, shall be computed for each selected step
as follows:
BX -
Ba
x 100
As
where AS is the span.
...