Standard Test Method for Determination of Boron, Silicon, and Technetium in Hydrolyzed Uranium Hexafluoride by Inductively Coupled Plasma—Mass Spectrometer After Removal of Uranium by Solid Phase Extraction

SIGNIFICANCE AND USE
5.1 This method is capable of measuring the concentration of boron, silicon, and technetium in UF6. Limits for these contaminants are set in Specifications C787 and C996.
SCOPE
1.1 This test method covers the determination of boron, silicon, and technetium in hydrolyzed uranium hexafluoride (UF6) by Inductively Coupled Plasma Mass Spectrometry (ICP-MS) after separation of the uranium by solid phase extraction.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Some specific hazards statements are given in Section 7 on Hazards.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

General Information

Status
Published
Publication Date
31-Oct-2019
Technical Committee
C26 - Nuclear Fuel Cycle
Drafting Committee
C26.05 - Methods of Test

Relations

Effective Date
01-Nov-2019
Effective Date
01-Jan-2024
Effective Date
01-Mar-2020
Effective Date
01-Mar-2020
Effective Date
01-Feb-2019
Effective Date
01-Jul-2015
Effective Date
01-Jul-2015
Effective Date
15-Jun-2014
Effective Date
15-Jan-2014
Effective Date
01-Jan-2014
Effective Date
01-Jun-2013
Effective Date
01-May-2013
Effective Date
01-Jun-2011
Effective Date
01-Nov-2010
Effective Date
01-Oct-2010

Overview

ASTM C1771-19 is the internationally recognized standard test method for the determination of boron, silicon, and technetium in hydrolyzed uranium hexafluoride (UF₆). This method employs Inductively Coupled Plasma–Mass Spectrometry (ICP-MS) for measurement after the removal of uranium by solid phase extraction. Developed by ASTM Committee C26 on Nuclear Fuel Cycle, this standard ensures precise measurement of these key impurities, supporting compliance with industry purity requirements specified in ASTM C787 and C996.

This standard is critical for laboratories and organizations and forms an essential part of nuclear fuel cycle quality control, enabling manufacturers and regulators to maintain strict contamination limits for boron, silicon, and technetium in uranium hexafluoride used in enrichment processes.

Key Topics

  • Principle of the Method: The test involves hydrolyzing UF₆ to a solution, chemically separating uranium via solid phase extraction using DAAP resin, followed by quantification of boron, silicon, and technetium with ICP-MS.
  • Measurement Units: All results are reported using SI units, supporting international consistency and traceability.
  • Sample Preparation: Careful attention is paid to eliminate uranium interference and to mimic sample processing with method blanks and recovery corrections, which ensures the validity and accuracy of results.
  • Precision and Bias: Data demonstrate reliable repeatability and accuracy, with relative standard deviations typically under 3.5% for all analytes, reinforcing confidence in the methodology.
  • Limits of Detection: The method specifies strict detection limits, enabling the identification of very low concentrations of each impurity, which is vital for quality assurance in nuclear fuel production.
  • Uncertainty of Measurement: The standard includes a detailed uncertainty assessment, helping laboratories satisfy regulatory and customer requirements for measurement quality.

Applications

  • Nuclear Fuel Quality Control: Ensures uranium hexafluoride meets purity specifications before enrichment, essential for fuel fabrication and reactor operation.
  • Regulatory Compliance: Assists facilities in meeting the contamination thresholds stipulated in ASTM C787 (for general UF₆) and ASTM C996 (for low-enriched UF₆).
  • Analytical Laboratories: Provides a validated, standardized procedure suitable for laboratories engaged in nuclear material analysis, promoting reliability and comparability across the industry.
  • Research and Development: Offers a robust framework for developing new instrumentation or refining analytical methods for trace element detection in complex nuclear matrices.

Related Standards

  • ASTM C787: Specification for Uranium Hexafluoride for Enrichment.
  • ASTM C996: Specification for Uranium Hexafluoride Enriched to Less Than 5% ²³⁵U.
  • ASTM C859: Terminology Relating to Nuclear Materials.
  • ASTM C1346: Practice for Dissolution of UF₆ from P-10 Tubes.
  • ASTM C1689: Practice for Subsampling of Uranium Hexafluoride.
  • ASTM D1193: Specification for Reagent Water.

For up-to-date documentation, refer to resources at ASTM International. Following ASTM C1771-19 ensures laboratories and facilities maintain rigorous controls over boron, silicon, and technetium contamination in UF₆, safeguarding nuclear fuel quality and regulatory compliance.

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ASTM C1771-19 - Standard Test Method for Determination of Boron, Silicon, and Technetium in Hydrolyzed Uranium Hexafluoride by Inductively Coupled Plasma—Mass Spectrometer After Removal of Uranium by Solid Phase Extraction

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Frequently Asked Questions

ASTM C1771-19 is a standard published by ASTM International. Its full title is "Standard Test Method for Determination of Boron, Silicon, and Technetium in Hydrolyzed Uranium Hexafluoride by Inductively Coupled Plasma—Mass Spectrometer After Removal of Uranium by Solid Phase Extraction". This standard covers: SIGNIFICANCE AND USE 5.1 This method is capable of measuring the concentration of boron, silicon, and technetium in UF6. Limits for these contaminants are set in Specifications C787 and C996. SCOPE 1.1 This test method covers the determination of boron, silicon, and technetium in hydrolyzed uranium hexafluoride (UF6) by Inductively Coupled Plasma Mass Spectrometry (ICP-MS) after separation of the uranium by solid phase extraction. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Some specific hazards statements are given in Section 7 on Hazards. 1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

SIGNIFICANCE AND USE 5.1 This method is capable of measuring the concentration of boron, silicon, and technetium in UF6. Limits for these contaminants are set in Specifications C787 and C996. SCOPE 1.1 This test method covers the determination of boron, silicon, and technetium in hydrolyzed uranium hexafluoride (UF6) by Inductively Coupled Plasma Mass Spectrometry (ICP-MS) after separation of the uranium by solid phase extraction. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Some specific hazards statements are given in Section 7 on Hazards. 1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ASTM C1771-19 is classified under the following ICS (International Classification for Standards) categories: 27.120.30 - Fissile materials and nuclear fuel technology. The ICS classification helps identify the subject area and facilitates finding related standards.

ASTM C1771-19 has the following relationships with other standards: It is inter standard links to ASTM C1771-13, ASTM C859-24, ASTM C787-20, ASTM C996-20, ASTM C1346-19, ASTM C787-15, ASTM C996-15, ASTM C859-14a, ASTM C859-14, ASTM C1346-08(2014), ASTM C859-13a, ASTM C859-13, ASTM C787-11, ASTM C859-10b, ASTM C996-10. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

ASTM C1771-19 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.

Standards Content (Sample)


This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation:C1771 −19
Standard Test Method for
Determination of Boron, Silicon, and Technetium in
Hydrolyzed Uranium Hexafluoride by Inductively Coupled
Plasma—Mass Spectrometer After Removal of Uranium by
Solid Phase Extraction
This standard is issued under the fixed designation C1771; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope Less Than 5 % U
C1346 Practice for Dissolution of UF from P-10 Tubes
1.1 This test method covers the determination of boron,
C1689 Practice for Subsampling of Uranium Hexafluoride
silicon, and technetium in hydrolyzed uranium hexafluoride
D1193 Specification for Reagent Water
(UF ) by Inductively Coupled Plasma Mass Spectrometry
(ICP-MS) after separation of the uranium by solid phase
3. Terminology
extraction.
3.1 Definitions:
1.2 The values stated in SI units are to be regarded as
3.1.1 For definitions of other standard terms in this test
standard. No other units of measurement are included in this
method, refer to Terminology C859.
standard.
3.2 Definitions of Terms Specific to This Standard:
1.3 This standard does not purport to address all of the
3.2.1 internal reference solution, n—a solution containing
safety concerns, if any, associated with its use. It is the
non-analyte elements, the signal from which is used to correct
responsibility of the user of this standard to establish appro-
for variation in the performance of a measuring instrument
priate safety, health, and environmental practices and deter-
through the course of analyzing a batch of samples, thereby
mine the applicability of regulatory limitations prior to use.
improving precision.
Some specific hazards statements are given in Section 7 on
3.2.2 method blank, n—a solution which in so far as is
Hazards.
practical duplicates the sample to be analyzed and passes
1.4 This international standard was developed in accor-
through the same measurement process but does not initially
dance with internationally recognized principles on standard-
contain significant quantities of any of the analytes to be
ization established in the Decision on Principles for the
measured.
Development of International Standards, Guides and Recom-
3.2.2.1 Discussion—The method blank does not initially
mendations issued by the World Trade Organization Technical
contain significant quantities of analyte, hence the value of any
Barriers to Trade (TBT) Committee.
analyte measured may be assumed to be due to interference,
matrix effects or contamination introduced as a consequence of
2. Referenced Documents
sample processing. The contribution of such factors to the
2.1 ASTM Standards:
value measured on the genuine sample may therefore be
C787 Specification for Uranium Hexafluoride for Enrich-
eliminated by subtracting the measured value for the method
ment
blank,typicallyprovidingabetterestimateforthetruevalueof
C859 Terminology Relating to Nuclear Materials
the quantity of analyte in the sample.
C996 Specification for Uranium Hexafluoride Enriched to
3.2.3 recovery correction, n—a factor applied to the mea-
sured value of the analyte in the sample to account for losses
This test method is under the jurisdiction ofASTM Committee C26 on Nuclear of analyte during sample processing.
Fuel Cycle and is the direct responsibility of Subcommittee C26.05 on Methods of
3.2.3.1 Discussion—Some of the analyte originally present
Test.
in a sample is likely to be lost during the process of preparing
Current edition approved Nov. 1, 2019. Published March 2020. Originally
the sample for instrumental measurement, so that the measured
approved in 2013. Last previous edition approved in 2013 as C1771 – 13. DOI:
10.1520/C1771-19.
value will typically be subject to negative bias. The proportion
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
of analyte lost may be estimated by repeated measurement of
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
a sample containing a known quantity of the analyte and a
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website. correction factor introduced to account for losses. Recovery
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
C1771−19
correction is only required when analyte losses are significant 7.1.2 Balance to read to 0.01 g intervals or less.
when compared with overall measurement uncertainty. 7.1.3 Appropriately sized, variable volume pipettes such as
1 to 10 mL; 100 to 1200 µL; 20 to 300 µL; 5 to 100 µL used
3.2.4 spike, n—a known quantity of analyte added to a
with polyethylene pipette tips.
sample.
7.1.4 Appropriately sized plastic, spouted measuring cylin-
4. Summary of Test Method ders (for preparing dilute acids).
7.1.5 Plastic beakers, 100 mL size.
4.1 A4 % by weight solution of UF is initially prepared by
7.1.6 Low density polyethylene bottles with leak proof lids,
reacting a quantity of UF with water. Sub-sampling of UF
6 6
various sizes.
may be carried out as described in Practice C1689. Preparation
of the hydrolyzed solution may be carried out as described in
NOTE 4—PFAcontainers may be used as an alternative and may help to
Practice C1346. The laboratory may choose to adopt a simpli- reduce silicon background levels.
fied version of the standard practices, or to adopt other
7.1.7 Polyfluoroalkoxy fluorocarbon plastic (PFA) bottles,
practices,providedthatanyadditionalerrortherebyintroduced
various sizes.
is incorporated within precision statements for the method.
7.1.8 Polyethylenesampletubeswithleakprooflids,25and
4.2 Concentratednitricacidisaddedtotheuraniumsolution 50 mL size.
to give a nitric acid concentration of approximately 1.5 M.The 7.1.9 Disposable Gloves—impermeable and powder free to
solution is then passed through a diamyl amylphosphonate
avoid the potential for contamination and to provide protection
(DAAP) resin column which retains the uranium. Boron, against toxic and corrosive substances. PVC gloves are suit-
silicon, and technetium are eluted from the column with 2 M
able.
nitric acid and the solution made up to volume with reagent
NOTE5—Theuseofglasswaremustbeavoidedthroughoutthismethod
water. The boron, silicon, and technetium concentrations are
as interaction with acid fluoride solutions will affect the silicon measure-
then measured using an ICP-MS.An on-line internal reference
ment.
solution may be used to correct results for any instrumental
drift and results are blank corrected using a prepared method
8. Reagents and Materials
blank.
8.1 ThesensitivityoftheICP-MStechniquerequirestheuse
NOTE 1—The method described herein usesa3mL sample of 4 % by
of ultra high purity reagents in order to be able to obtain low
weight UF solution. The apparatus and the quantities and concentrations
levels of detection and satisfactory precision. All the reagents
of reagents and materials described in the standard are appropriate to this
below are ultra high purity grade unless otherwise stated.
samplesizeandconcentration.ThedatapresentedinSection14havebeen
8.1.1 Concentrated nitric acid, specific gravity 1.42, 16 M.
generatedusingsamplesofthissizeandconcentration.Alternativesample
sizes and concentrations may be used but will require that the laboratory
8.1.2 Concentrated hydrochloric acid, specific gravity 1.18,
adjust apparatus, reagents and materials accordingly and validate the
11.3 M.
method for the adjusted conditions.
8.1.3 Concentrated hydrofluoric acid, 48 % by weight or
similar concentration.
5. Significance and Use
8.1.4 Reagent water conforming to Specification D1193.
5.1 This method is capable of measuring the concentration
8.1.5 Nitric acid, 0.32 M (200 mL of concentrated nitric
of boron, silicon, and technetium in UF . Limits for these
acid diluted to 10 L or equivalent ratio).
contaminants are set in Specifications C787 and C996.
8.1.6 Nitric acid, 2 M (125 mL of concentrated nitric acid
diluted to 1 L or equivalent ratio).
6. Interferences
8.1.7 Nitric acid, 3 M (188 mL of concentrated nitric acid
99 99
6.1 Tc suffers an isobaric interference with Ru and a
diluted to 1 L or equivalent ratio).
98 +
molecular interference due to MoH ions; however, the
8.1.8 Hydrochloric acid, 0.1 M (8.8 mL of concentrated
diluted, hydrolyzed UF samples should not give rise to any
hydrochloric acid diluted to 1 L or equivalent ratio).
99 98 +
significant amount of Ru or MoH ions.
8.1.9 Two independent 10 000 mg/L silicon standards (one
for calibration, one for sample spiking and Quality Control).
7. Apparatus
8.1.10 Two independent 1000 mg/L boron standards (one
7.1 Ordinary laboratory apparatus are not listed but are
for calibration, one for sample spiking and Quality Control).
assumed to be present.
8.1.11 Two independent technetium standards (one for
7.1.1 ICP-MS controlled by computer and fitted with asso-
calibration, one for sample spiking and Quality Control).
ciated software and peripherals, including an inert sample
Concentrations at 52.04 Bq/mL (82 µg⁄L) and 63.24 Bq/mL
introduction system.
(100 µg/L) have proven acceptable but other similar values
may be used if precisely known.
NOTE 2—A standard quartz sample introduction system is not suitable
as it will affect the silicon measurement. A perfluoroalkoxy fluorocarbon 8.1.12 1000 mg/L indium, scandium and beryllium stan-
plastic (PFA) introduction system with platinum injector has proven
dards (used for internal reference solutions).
acceptable. New equipment may need to be pre-soaked or flushed with a
dilute hydrofluoric acid solution, or both, to obtain a stable silicon NOTE 6—Alternative elements may be used for the internal reference
background. solution. Care must be taken to ensure consistency between batches of
NOTE 3—It is recommended that an auto sampler with tube racks and standardswheretheelementchosenhasmorethanonenaturallyoccurring
plastic sample tubes compatible with the ICP-MS be used. isotope.
C1771−19
8.1.13 Synthetic Pseudo Blank Matrix. 29 mL of 48 % by 500 ng⁄L Tc)—Place a labeled 125 mL PFA bottle on to a
weighthydrofluoricaciddilutedto1Lorequivalentmixtureto balance and tare. Add approximately 50 mL of 0.32 M nitric
produce a 1.3 % by weight fluoride solution (equivalent acid to the bottle. Pipet 0.25 mLof 1000 mg⁄Lboron standard,
fluoride concentration toa4%by weight UF solution). Store 1.0 mL of 10 000 mg/L silicon standard, and 0.61 mL of
in a PFA bottle and mix thoroughly before use. 82 µg⁄L technetium standard solution into the bottle. Make up
8.1.14 Bulked Pseudo Blank Matrix. This is synthetic to 101 6 0.5 g with 0.32 M nitric acid.Add screw top lid and
pseudo blank matrix that has passed through the preparation mix thoroughly.
and solid phase extraction process described in 12.1 – 12.10,
NOTE 8—The volume of a technetium standard with a different starting
measured and shown to contain very low levels of boron,
concentration should be adjusted to give the required final concentration
silicon, and technetium. It is used to prepare calibration
of 500 ng/L, or any different concentration deemed more appropriate to
the requirements of the laboratory (see 10.1).
standards and instrument quality control samples.
NOTE 9—The density of 0.32 M nitric acid at 20 °C is taken to be
8.1.15 Pre-packed DAAP resin columns, 2 mL, together
1.009 g⁄mL.
with reservoirs and end caps as appropriate.
10.4 Boron, Silicon, and Technetium Blank Calibration
NOTE 7—New columns may need to be pre-treated before first use to
Standard—Place a labeled 125 mL PFA bottle on to a balance
remove trace silicon contamination. Pre-treatment may be carried out by
and tare. Add 101 6 0.5 g of Bulked Pseudo Blank Matrix to
passingsamplematerialthatdoesnotrequireanalysisthroughthecolumn,
eluting and regenerating the column as described in Section 12. the bottle. Add screw top lid and mix thoroughly.
8.1.16 Argon gas (carrier gas for the ICP-MS), >99.99 %
10.5 Boron, Silicon, and Technetium Calibration Standard 1
purity.
(10 µg/L B, 400 µg/L Si, and 2.0 ng/L Tc)—Place a labeled
125mLPFAbottleontoabalanceandtare.Addapproximately
9. Hazards
50 mL of Bulked Pseudo Blank Matrix to the bottle. Pipet
9.1 Adequate laboratory facilities, such as fume hoods and 0.4 mL of Boron, Silicon, and Technetium Stock Solution into
controlledventilation,alongwithsafetechniques,mustbeused the bottle and make up to 101 6 0.5 g with Bulked Pseudo
in this procedure. Extreme care should be exercised in using Blank Matrix. Add screw top lid and mix thoroughly.
hydrofluoric and other concentrated acids. Use of chemical
10.6 Boron, Silicon, and Technetium Calibration Standard 2
resistant gloves and eye protection is recommended. Refer to 99
(20 µg/L B, 800 µg/L Si, and 4.0 ng/L Tc)—Boron, Silicon,
the laboratory’s health and safety arrangements and other
and Technetium Calibration Standard 2Place a labeled 125 mL
applicable guidance for handling chemical and radioactive
PFAbottle on to a balance and tare.Add approximately 50 mL
materials and for the management of radioactive, mixed, and
of Bulked Pseudo Blank Matrix to the bottle. Pipet 0.8 mL of
hazardous waste.
Boron, Silicon, and Technetium Stock Solution into the bottle
9.2 Hydrofluoric acid is a highly corrosive acid that can
andmakeupto101 60.5gwithBulkedPseudoBlankMatrix.
severely burn skin, eyes, and mucous membranes. Hydroflu- Add screw top lid and mix thoroughly.
oric acid differs from other acids because the fluoride ion
10.7 Boron, Silicon, and Technetium Calibration Standard 3
readily penetrates the skin, causing destruction of deep tissue 99
(50 µg/L B, 2.0 mg/L Si, and 10 ng/L Tc)—Place a labeled
layers. Unlike other acids that are rapidly neutralized, hydro-
125 mLPFAbottleontoabalanceandtare.Addapproximately
fluoric acid reactions with tissue may continue for days if left
50 mL of Bulked Pseudo Blank Matrix to the bottle. Pipet
untreated.FamiliarizationandcompliancewiththeSafetyData
2.0 mL of Boron, Silicon, and Technetium Stock Solution into
Sheet is essential.
the bottle and make up to 101 6 0.5 g with Bulked Pseudo
9.3 The ICP-MS is a source of intense ultra-violet radiation
Blank Matrix. Add screw top lid and mix thoroughly.
from the radio frequency induced plasma. Protection from
10.8 Boron, Silicon, and Technetium Instrument Quality
radio frequency radiation and UV radiation is provided by the
Control Stock/Spike Solution (12.5 mg/L B, 500 mg/L Si, and
instrument under normal operation.
2.5 µg /L Tc)—Place a labeled 125 mL PFA bottle on to a
balance and tare. Add approximately 50 mL of 0.32 M nitric
10. Calibration and Standardization
acid to the bottle. Pipet 1.25 mLof 1000 mg/Lboron standard,
10.1 The standards and blanks described below are pre-
5.0 mL of 10 000 mg/L silicon standard, and 2.5 mL of
pared.The laboratory may choose to prepare different volumes
100 µg⁄L technetium standard into the bottle (see Note 6).
of these materials and at different concentrations where appro-
Makeupto101 60.5 gwith0.32Mnitricacid.Addscrewtop
priate to the requirements of the laboratory and the measure-
lid and mix thoroughly. The standards used for this solution
ment to be performed.
should be different from those used to prepare the Boron,
Silicon, andTechnetium Stock Solution used for preparation of
10.2 Internal Reference Solution (50 µg/L In, 100 µg/L Sc
and 500 µg⁄L Be)—Add approximately 1.5 L of 0.32 M nitric calibration standards.
acid toa2LPFA bottle. Pipet 0.1 mL of 1000 mg/L indium
10.9 Boron, Silicon, and Technetium Instrument Quality
standard, 0.2 mLof 1000 mg/Lscandium standard, and 1.0 mL
Control Sample (25 µg/L B, 1000 µg/L Si, and 5 ng/L
of 1000 mg/L beryllium standard into the bottle. Fill up to the
Tc)—Place a labeled 125 mL PFAbottle on to a balance and
2 L mark with 0.32 M nitric acid. Mix thoroughly before use.
tare. Add approximately 50 mL of Bulked Pseudo Blank
10.3 Boron, Silicon, and Technetium Stock Solution Used Matrix to the bottle. Pipet 0.2 mL of Boron Silicon, and
for Calibration Standards (2.5 mg/L B, 100 mg⁄L Si, and Technetium Instrument Quality Control Stock/Spike Solution
C1771−19
into the bottle and make up to 101 g 6 0.5 g with Bulked 12.6 Take an appropriate number of 50 mL sample tubes
Pseudo Blank Matrix. Add screw top lid and mix thoroughly. withlidsandlabelwithsampledetails.Onetubeisrequiredfor
each 25 mLsample tube that has been prepared. Place a 50 mL
11. Conditioning
sample tube below each of the pre-conditioned DAAP column
pairs (see 11.4.1 – 11.4.3).
11.1 Sometypesofsampletubemayrequirecleaningbefore
use due to high levels of background silicon contamination. If
12.7 Add the contents of each 25 mL sample tube to the
this is found to be the case then tubes or lids may be cleaned
reservoirfittedtothetopcolumnofaseparatecolumnpair.Use
by soaking for at least 1 hr, preferably overnight, in 0.32 M
a few mLof 2M nitric acid to rinse the sample tube and lid and
nitricacid.Priortousethetubes/lidsmustberinsedthreetimes
also add the rinsing to the reservoir. Allow to drain fully
with reagent water and any excess liquid shaken off.
through both columns into the 50 mL sample tube.
11.2 The uranium removal process may use a single DAAP
12.8 Pipet 5 mLof 2 M nitric acid into the reservoir fitted to
column or a pair of DAAPcolumns in series depending on the
the top column of each column pair and allow to drain fully
quantity of uranium in the sample. The procedure as described
through both columns. Repeat with a second 5 mL aliquot of
assumes the use of a pair of DAAP columns in series. 2 M nitric acid.
11.3 A column pair is required for each sample in a batch,
12.9 Once the columns have fully drained make up to
any spiked samples and a method blank. Prepa
...


This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: C1771 − 13 C1771 − 19
Standard Test Method for
Determination of Boron, Silicon, and Technetium in
Hydrolyzed Uranium Hexafluoride by Inductively Coupled
Plasma—Mass Spectrometer After Removal of Uranium by
Solid Phase Extraction
This standard is issued under the fixed designation C1771; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This test method covers the determination of boron, silicon, and technetium in hydrolyzed uranium hexafluoride (UF ) by
Inductively Coupled Plasma Mass Spectrometry (ICP-MS) after separation of the uranium by solid phase extraction.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety safety, health, and healthenvironmental practices and determine the
applicability of regulatory limitations prior to use. Some specific hazards statements are given in Section 7 on Hazards.
1.4 This international standard was developed in accordance with internationally recognized principles on standardization
established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued
by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
2. Referenced Documents
2.1 ASTM Standards:
C787 Specification for Uranium Hexafluoride for Enrichment
C859 Terminology Relating to Nuclear Materials
C996 Specification for Uranium Hexafluoride Enriched to Less Than 5 % U
C1346 Practice for Dissolution of UF from P-10 Tubes
C1689 Practice for Subsampling of Uranium Hexafluoride
D1193 Specification for Reagent Water
3. Terminology
3.1 Definitions—For definitions of other standard terms in this test method, refer to Terminology C859.
3.1 Definitions:
3.1.1 For definitions of other standard terms in this test method, refer to Terminology C859.
3.2 Definitions:Definitions of Terms Specific to This Standard:
3.2.1 internal reference solution, n—a solution containing non-analyte elements, the signal from which is used to correct for
variation in the performance of a measuring instrument through the course of analyzing a batch of samples, thereby improving
precision.
3.2.2 method blank, n—a solution which in so far as is practical duplicates the sample to be analyzed and passes through the
same measurement process but does not initially contain significant quantities of any of the analytes to be measured.
3.2.2.1 Discussion—
This test method is under the jurisdiction of ASTM Committee C26 on Nuclear Fuel Cycle and is the direct responsibility of Subcommittee C26.05 on Methods of Test.
Current edition approved Jan. 1, 2013Nov. 1, 2019. Published February 2013March 2020. Originally approved in 2013. Last previous edition approved in 2013 as
C1771 – 13. DOI: 10.1520/C1771-1310.1520/C1771-19.
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
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The method blank does not initially contain significant quantities of analyte, hence the value of any analyte measured may be
assumed to be due to interference, matrix effects or contamination introduced as a consequence of sample processing,processing.
The contribution of such factors to the value measured on the genuine sample may therefore be eliminated by subtracting the
measured value for the method blank, typically providing a better estimate for the true value of the quantity of analyte in the
sample.
3.2.3 recovery correction, n—a factor applied to the measured value of the analyte in the sample to account for losses of analyte
during sample processing.
3.2.3.1 Discussion—
Some of the analyte originally present in a sample is likely to be lost during the process of preparing the sample for instrumental
measurement, so that the measured value will typically be subject to negative bias. The proportion of analyte lost may be estimated
by repeated measurement of a sample containing a known quantity of the analyte and a correction factor introduced to account for
losses. Recovery correction is only required when analyte losses are significant when compared with overall measurement
uncertainty.
3.2.4 spike, n—a known quantity of analyte added to a sample.
4. Summary of Test Method
4.1 A 4 % by weight solution of UF is initially prepared by reacting a quantity of UF with water. Sub-sampling of UF may
6 6 6
be carried out as described in Practice C1689. Preparation of the hydrolyzed solution may be carried out as described in Practice
C1346. The laboratory may choose to adopt a simplified version of the standard practices, or to adopt other practices, provided
that any additional error thereby introduced is incorporated within precision statements for the method.
4.2 Concentrated nitric acid is added to the uranium solution to give a nitric acid concentration of approximately 1.5 M. The
solution is then passed through a diamyl amylphosphonate (DAAP) resin column which retains the uranium. Boron, silicon, and
technetium are eluted from the column with 2 M nitric acid and the solution made up to volume with reagent water. The boron,
silicon, and technetium concentrations are then measured using an ICP-MS. An on-line internal reference solution may be used
to correct results for any instrumental drift and results are blank corrected using a prepared method blank.
NOTE 1—The method described in this standard herein uses a 3 mL sample of 4 % by weight UF solution. The apparatus and the quantities and
concentrations of reagents and materials described in the standard are appropriate to this sample size and concentration. The data presented in Section
14 have been generated using samples of this size and concentration. Alternative sample sizes and concentrations may be used but will require that the
laboratory adjust apparatus, reagents and materials accordingly and validate the method for the adjusted conditions.
5. Significance and Use
5.1 This method is capable of measuring the concentration of boron, silicon, and technetium in UF . Limits for these
contaminants are set in Specifications C787 and C996.
6. Interferences
99 99 98 +
6.1 Tc suffers an isobaric interference with Ru and a molecular interference due to MoH ions; however, the diluted,
99 98 +
hydrolyzed UF samples should not give rise to any significant amount of Ru or MoH ions.
7. Apparatus
7.1 Ordinary laboratory apparatus are not listed but are assumed to be present.
7.1.1 ICP-MS controlled by computer and fitted with associated software and peripherals, including an inert sample introduction
system.
NOTE 2—A standard quartz sample introduction system is not suitable as it will affect the silicon measurement. A perfluoroalkoxy fluorocarbon plastic
(PFA) introduction system with platinum injector has proven acceptable. New equipment may need to be pre-soaked or flushed with a dilute hydrofluoric
acid solution, or both, to obtain a stable silicon background.
NOTE 3—It is recommended that an auto sampler with tube racks and plastic sample tubes compatible with the ICP-MS be used.
7.1.2 Balance to read to 0.01 g intervals or less.
7.1.3 Appropriately sized, variable volume pipettes such as 1 to 10 mL; 100 to 1200 μL; 20 to 300 μL; 5 to 100 μL used with
polyethylene pipette tips.
7.1.4 Appropriately sized plastic, spouted measuring cylinders (for preparing dilute acids).
7.1.5 Plastic beakers, 100 mL size.
7.1.6 Low density polyethylene bottles with leak proof lids, various sizes.
NOTE 4—PFA containers may be used as an alternative and may help to reduce silicon background levels.
7.1.7 Polyfluoroalkoxy fluorocarbon plastic (PFA) bottles, various sizes.
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7.1.8 Polyethylene sample tubes with leak proof lids, 25 mL and 50 mL 50 mL size.
7.1.9 Disposable Gloves—impermeable and powder free to avoid the potential for contamination and to provide protection
against toxic and corrosive substances. PVC gloves are suitable.
NOTE 5— The use of glassware must be avoided throughout this method as interaction with acid fluoride solutions will affect the silicon measurement.
8. Reagents and Materials
8.1 The sensitivity of the ICP-MS technique requires the use of ultra high purity reagents in order to be able to obtain low levels
of detection and satisfactory precision. All the reagents below are ultra high purity grade unless otherwise stated.
8.1.1 Concentrated nitric acid, specific gravity 1.42, 16 M.
8.1.2 Concentrated hydrochloric acid, specific gravity 1.18, 11.3 M.
8.1.3 Concentrated hydrofluoric acid, 48 % by weight or similar concentration.
8.1.4 Reagent water conforming to Specification D1193.
8.1.5 Nitric acid, 0.32 M (200 mL of concentrated nitric acid diluted to 10 L or equivalent ratio).
8.1.6 Nitric acid, 2 M (125 mL of concentrated nitric acid diluted to 1 L or equivalent ratio).
8.1.7 Nitric acid, 3 M (188 mL of concentrated nitric acid diluted to 1 L or equivalent ratio).
8.1.8 Hydrochloric acid, 0.1 M (8.8 mL of concentrated hydrochloric acid diluted to 1 L or equivalent ratio).
8.1.9 Two independent 10 000 mg/L silicon standards (one for calibration, one for sample spiking and Quality Control).
8.1.10 Two independent 1000 mg/L boron standards (one for calibration, one for sample spiking and Quality Control).
8.1.11 Two independent technetium standards (one for calibration, one for sample spiking and Quality Control). Concentrations
at 52.04 Bq/mL (82(82 μg μg/L) ⁄L) and 63.24 Bq/mL (100 μg/L) have proven acceptable but other similar values may be used
if precisely known.
8.1.12 1000 mg/L indium, scandium and beryllium standards (used for internal reference solutions).
NOTE 6—Alternative elements may be used for the internal reference solution. Care must be taken to ensure consistency between batches of standards
where the element chosen has more than one naturally occurring isotope.
8.1.13 Synthetic Pseudo Blank Matrix. 29 mL of 48 % by weight hydrofluoric acid diluted to 1 L or equivalent mixture to
produce a 1.3 % by weight fluoride solution (equivalent fluoride concentration to a 4 % by weight UF solution). Store in a PFA
bottle and mix thoroughly before use.
8.1.14 Bulked Pseudo Blank Matrix. This is synthetic pseudo blank matrix that has passed through the preparation and solid
phase extraction process described in paragraphs 12.1 – 12.10, measured and shown to contain very low levels of boron, silicon,
and technetium. It is used to prepare calibration standards and instrument quality control samples.
8.1.15 Pre-packed DAAP resin columns, 2 mL, together with reservoirs and end caps as appropriate.
NOTE 7—New columns may need to be pre-treated before first use to remove trace silicon contamination. Pre-treatment may be carried out by passing
sample material that does not require analysis through the column, eluting and regenerating the column as described in Section 12.
8.1.16 Argon gas (carrier gas for the ICP-MS), >99.99 % purity.
9. Hazards
9.1 Adequate laboratory facilities, such as fume hoods and controlled ventilation, along with safe techniques, must be used in
this procedure. Extreme care should be exercised in using hydrofluoric and other concentrated acids. Use of chemical resistant
gloves and eye protection is recommended. Refer to the laboratory’s health and safety arrangements and other applicable guidance
for handling chemical and radioactive materials and for the management of radioactive, mixed, and hazardous waste.
9.2 Hydrofluoric acid is a highly corrosive acid that can severely burn skin, eyes, and mucous membranes. Hydrofluoric acid
is similar to other acids in that the initial extent of a burn depends on the concentration, the temperature, and the duration of contact
with the acid. Hydrofluoric acid differs from other acids because the fluoride ion readily penetrates the skin, causing destruction
of deep tissue layers. Unlike other acids that are rapidly neutralized, hydrofluoric acid reactions with tissue may continue for days
if left untreated. Due to the serious consequences of hydrofluoric acid burns, prevention of exposure or injury of personnel is the
primary goal. Utilization of appropriate laboratory controls (hoods) and wearing adequate personal protective equipment to protect
from skin and eye contact Familiarization and compliance with the Safety Data Sheet is essential.
9.3 The ICP-MS is a source of intense ultra-violet radiation from the radio frequency induced plasma. Protection from radio
frequency radiation and UV radiation is provided by the instrument under normal operation.
10. Calibration and Standardization
10.1 The standards and blanks described below are prepared. The laboratory may choose to prepare different volumes of these
materials and at different concentrations where appropriate to the requirements of the laboratory and the measurement to be
performed.
10.2 Internal Reference Solution (50 μg/L In, 100 μg/L Sc and 500 μg ⁄L Be)—Internal Reference Solution (50 μg/L In, 100 μg/L
Sc and 500 μg/L Be). Add approximately 1.5 L of 0.32 M nitric acid to a 2 L PFA bottle. Pipet 0.1 mL of 1000 mg/L indium
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standard, 0.2 mL of 1000 mg/L scandium standard, and 1.0 mL of 1000 mg/L beryllium standard into the bottle. Fill up to the 2
L mark with 0.32 M nitric acid. Mix thoroughly before use.
10.3 Boron, Silicon, and Technetium Stock Solution Used for Calibration Standards (2.5 mg/L B, 100 mg ⁄L Si, and 500 ng ⁄L
99 99
Tc)—Boron, Silicon and Technetium Stock Solution, used for calibration standards (2.5 mg/L B, 100 mg/L Si and 500 ng/L Tc).
Place a labeled 125 mL PFA bottle on to a balance and tare. Add approximately 50 mL of 0.32 M nitric acid to the bottle. Pipet
0.25 mL 0.25 mL of 10001000 mg mg/L ⁄L boron standard, 1.0 mL of 10 000 mg/L silicon standard, and 0.61 mL 0.61 mL of
8282 μg μg/L ⁄L technetium standard solution into the bottle. Make up to 101 g (60.5 g)6 0.5 g with 0.32 M nitric acid. Add screw
top lid and mix thoroughly.
NOTE 8—The volume of a technetium standard with a different starting concentration should be adjusted to give the required final concentration of 500
ng/L, or any different concentration deemed more appropriate to the requirements of the laboratory (see 10.1).
NOTE 9—The density of 0.32 M nitric acid at 20°C20 °C is taken to be 1.0091.009 g g/mL. ⁄mL.
10.4 Boron, Silicon, and Technetium Blank Calibration Standard—Boron Silicon and Technetium Blank Calibration
Standard.Place a labeled 125 mL 125 mL PFA bottle on to a balance and tare. Add 101 g (60.5 g)6 0.5 g of Bulked Pseudo Blank
Matrix to the bottle. Add screw top lid and mix thoroughly.
10.5 Boron, Silicon, and Technetium Calibration Standard 1 (10 μg/L B, 400 μg/L Si, and 2.0 ng/L Tc)—Boron, Silicon and
Technetium Calibration Standard 1 (10 μg/L B, 400 μg/L Si and 2.0 ng/L Tc). Place a labeled 125 mL PFA bottle on to a balance
and tare. Add approximately 50 mL of Bulked Pseudo Blank Matrix to the bottle. Pipet 0.4 mL 0.4 mL of Boron, Silicon, and
Technetium Stock Solution into the bottle and make up to 101 g (60.5 g)6 0.5 g with Bulked Pseudo Blank Matrix. Add screw
top lid and mix thoroughly.
10.6 Boron, Silicon, and Technetium Calibration Standard 2 (20 μg/L B, 800 μg/L Si, and 4.0 ng/L Tc)—Boron, Silicon, and
Technetium Calibration Standard 2 (20 μg/L B, 800 μg/L Si and 4.0 ng/L Tc). Place a labeled 125 mL 125 mL PFA bottle on
to a balance and tare. Add approximately 50 mL 50 mL of Bulked Pseudo Blank Matrix to the bottle. Pipet 0.8 mL 0.8 mL of
Boron, Silicon, and Technetium Stock Solution into the bottle and make up to 101 g (60.5 g)6 0.5 g with Bulked Pseudo Blank
Matrix. Add screw top lid and mix thoroughly.
10.7 Boron, Silicon, and Technetium Calibration Standard 3 (50 μg/L B, 2.0 mg/L Si, and 10 ng/L Tc)—Boron, Silicon and
Technetium Calibration Standard 3 (50 μg/L B, 2.0 mg/L Si and 10 ng/L Tc). Place a labeled 125 mL 125 mL PFA bottle on to
a balance and tare. Add approximately 50 mL 50 mL of Bulked Pseudo Blank Matrix to the bottle. Pipet 2.0 mL 2.0 mL of Boron,
Silicon, and Technetium Stock Solution into the bottle and make up to 101 g (60.5 g)6 0.5 g with Bulked Pseudo Blank Matrix.
Add screw top lid and mix thoroughly.
10.8 Boron, Silicon, and Technetium Instrument Quality Control Stock/Spike Solution (12.5 mg/L B, 500 mg/L Si, and 2.5 μg
/L Tc)—Boron, Silicon and Technetium Instrument Quality Control Stock/Spike Solution (12.5 mg/L B, 500 mg/L Si and 2.5 μg
/L Tc). Place a labeled 125 mL PFA bottle on to a balance and tare. Add approximately 50 mL 50 mL of 0.32 M nitric acid to
the bottle. Pipet 1.25 mL of 1000 mg/L boron standard, 5.0 mL 5.0 mL of 10 000 mg/L silicon standard, and 2.5 mL 2.5 mL of
100100 μg μg/L ⁄L technetium standard into the bottle (see Note 6). Make up to 101 g (60.5g)6 0.5 g with 0.32 M nitric acid.
Add screw top lid and mix thoroughly. The standards used for this solution should be different from those used to prepare the
Boron, Silicon, and Technetium Stock Solution used for preparation of calibration standards.
10.9 Boron, Silicon, and Technetium Instrument Quality Control Sample (25 μg/L B, 1000 μg/L Si, and 5 ng/L Tc)—Boron,
Silicon and Technetium Instrument Quality Control Sample (25 μg/L B, 1000 μg/L Si and 5 ng/L Tc). Place a labeled 125 mL
PFA bottle on to a balance and tare. Add approximately 50 mL of Bulked Pseudo Blank Matrix to the bottle. Pipet 0.2 mL of Boron
Silicon, and Technetium Instrument Quality Control Stock/Spike Solution into the bottle and make up to 101 g (60.5 g)6 0.5 g
with Bulked Pseudo Blank Matrix. Add screw top lid and mix thoroughly.
11. Conditioning
11.1 Some types of sample tube may require cleaning before use due to high levels of background silicon contamination. If this
is found to be the case then tubes or lids may be cleaned by soaking for at least 1 hr, preferably overnight, in 0.32 M nitric acid.
Prior to use the tubes/lids must be rinsed three times with reagent water and any excess liquid shaken off.
11.2 The uranium removal process may use a single DAAP column or a pair of DAAP columns in series depending on the
quantity of uranium in the sample. The procedure as described assumes the use of a pair of DAAP columns in series.
11.3 A column pair is required for each sample in a batch, any spiked samples and a method blank. Preparation of Bulked
Pseudo Blank Matrix may also be carried out alongside sample analysis and will require additional column pairs.
11.4 Each column pair is prepared and conditioned as follows:
11.4.1 The pair is set up, one above the other in a column rack or other suitable holder. Each column is checked for bubbling
or voiding in the resin and for any yellow coloration and discarded if necessary.
11.4.2 A clean, 25 mL reservoir accessory is attached to each column and a plastic beaker is placed under the lower column.
The end caps are removed and the column contents allowed to drain into the beakers.
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11.4.3 A pipette is used to add 5 mL of 3 M nitric acid to the reservoir fitted to the upper column and allowed to drain through
both columns. The contents of the beaker are discarded as waste. The columns are n
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