January 2026 Updates: Essential New Standards in Metrology and Measurement of Physical Phenomena

In January 2026, the field of Metrology and Measurement of Physical Phenomena saw the publication of four significant international standards, shaping the way professionals measure, analyze, and ensure quality in advanced materials and optical systems. These standards – covering electrical insulating materials, ellipsometric analysis, and high-frequency conductivity testing – introduce updated procedures and requirements that will profoundly impact laboratory practice, compliance, and technological research. Every organization committed to quality, reliability, and innovation in measurement should be aware of these changes.

Overview

Measurement science (metrology) underpins the reliability, comparability, and accuracy of results across virtually every modern industry – from electronics to photonics and advanced materials. Standards in this field ensure that laboratories and organizations worldwide follow best-in-class methods for assessing material properties, verifying performance, and ensuring regulatory compliance.

This article condenses essential information on the four new and revised standards published in January 2026:

• Accelerated thermal ageing and data interpretation for electrical insulating materials
• Advanced ellipsometry models for optical/dielectric constant determination
• High-precision methods to measure electrical conductivity of metal thin films at high frequencies

Readers will learn about the scope, key requirements, technical advances, and practical implementation strategies for each standard, with direct links to the official documents on iTeh Standards.

Detailed Standards Coverage

EN IEC 60216-1:2026 – Ageing Procedures for Electrical Insulating Materials

Electrical insulating materials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results

This cornerstone standard sets forth comprehensive procedures for accelerated ageing of electrical insulating materials, facilitating the derivation of critical thermal endurance properties. Originally focused on insulators, its methodologies are now also widely applied to non-insulating materials subject to thermal stress.

Scope and Application:

• Defines general ageing conditions, test specimen preparation, environmental controls, and the interpretation of accelerated life data (using the Arrhenius relationship).
• Updated in the 2026 edition to clarify the temperature index (TI), add requirements for color-variations in materials, introduce thickness sensitivity testing, and remove outdated annexes.

Key Requirements:

• Selection and preparation of test specimens and test properties
• Exposure to specified temperature and humidity regimens
• Evaluation by non-destructive, proof, or destructive endpoint testing
• Statistical analysis of test data for mean, variance, and confidence intervals

Who Should Comply:

• Manufacturers and users of electrical insulation (wires, cables, laminates)
• Materials engineers, quality labs, and compliance teams
• Any sector where thermal stability and lifespan prediction are critical (e.g., automotive, power, electronics)

Practical Implications:

• Ensures accurate prediction of product lifetime under heat
• Promotes harmonized adoption of advanced test and analysis techniques globally
• Reduces failure risk and enhances product safety and reliability

What’s New in 2026:

• Refined TI definition (better life-prediction accuracy)
• Explicit handling of material color variants
• New test for thickness sensitivity
• Removal of legacy calculation annexes in favor of updated procedures

Key highlights:

• Advanced statistical treatment for thermal endurance
• New guidance on material color and thickness sensitivity
• Broader applicability to emerging materials

Access the full standard:View EN IEC 60216-1:2026 on iTeh Standards

ISO 23131-2:2026 – Ellipsometry: Bulk Material Model

Ellipsometry — Part 2: Bulk material model

This new part of the ISO 23131 series defines the process for determining a material’s optical (refractive index n and extinction coefficient k) or dielectric constants (real, ε1, and imaginary part, ε2) via ellipsometric measurements, assuming the bulk material model applies.

Scope and Application:

• Lays out the analytical approach for samples that are large, homogeneous, and lack thin surface layers or notable roughness.
• Specifies measurement and model validation protocols, detailing how pseudo-constants (, , <ε1>, <ε2>) can be derived from multiple-angle measurements and checked for consistency.

Key Requirements:

• Sample preparation: Surface must be free of films and roughness minimal (λ/250 or less)
• Measurement uncertainty estimation and reporting
• Statistical analysis of results using established ellipsometry formulas

Target Audience:

• Semiconductor and optics industries
• Laboratories requiring non-destructive optical or dielectric characterization
• Research institutions and academic labs

Practical Implications:

• Enables precise, model-based extraction of key physical constants
• Supports quality assurance for bulk optical materials
• Facilitates material selection and process qualification

Key highlights:

• Model assumption breakdown (surface quality, purity, isotropy)
• Step-by-step validation using multi-angle measurement
• Standardized uncertainty evaluation and robust reporting

Access the full standard:View ISO 23131-2:2026 on iTeh Standards

ISO 23131-3:2026 – Ellipsometry: Transparent Single Layer Model

Ellipsometry — Part 3: Transparent single layer model

Part 3 expands the ISO 23131 ellipsometry scope to single, transparent layers (where extinction coefficient k = 0). It details how to use ellipsometric data to simultaneously determine layer thickness (d) and refractive index (n) or dielectric constant (ε1) in multilayer optical systems.

Scope and Application:

• Applicable to transparent coatings, films, and surface layers on known substrates
• Assumes no absorption or scattering within the spectral region of interest
• Ideal for evaluating anti-reflective coatings, transparent thin films, and advanced nanostructures

Key Requirements:

• Transparent layer with well-defined chemical/microstructural properties
• Accurate surface/planarity alignment and low roughness
• Model validation through mapping and multi-point measurement if needed

Who Should Implement:

• Photonics and display technology labs
• R&D and QA groups in coatings, photovoltaics, and microelectronics
• Metrology service providers specializing in thin film characterization

Implementation Benefits:

• Reliable, non-destructive assessment of layer thickness and optical properties
• Standardization of test and reporting protocols
• Ensures international comparability of material specifications

Key highlights:

• Focus on zero-absorption, transparent layer systems
• Expanded uncertainty analysis for low-thickness films
• Compatibility with multi-layer and advanced substrate applications

Access the full standard:View ISO 23131-3:2026 on iTeh Standards

EN IEC 63616:2026 – High-Frequency Conductivity Measurement for Metal Thin Films

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

This standard updates industry best practices for measuring the electrical conductivity of metal thin films at microwave and millimeter-wave frequencies. It utilizes high-order modes of a balanced-type circular disk resonator (BCDR) for broadband, high-accuracy results.

Scope and Key Features:

• Direct measurement of conductivity for metal foils adhered to or deposited on substrates
• Method applicable for evaluating interfacial conductivity in the context of advanced electronics and microwave system manufacture
• Single resonator accommodates broadband frequency range (applicable for both foil and deposited films)

Technical Requirements:

• Detailed preparation and configuration of the BCDR apparatus
• Calibration steps for vector network analyzer integration
• Data analysis using prescribed theory and calculation equations
• Guidelines for periodic equipment validation/check-up

Target Industries:

• Electronics, telecommunications, and RF product development
• Materials science and advanced material labs
• Quality assurance for production of conductive films and complex assemblies

Practical Implications:

• Enhances accuracy and comparability of thin film conductivity data
• Reduces testing complexity across frequency ranges
• Fast turnaround for routine QA and advanced research applications

Key highlights:

• Enables broadband conductivity measurements
• Supports both foil and coated substrate configurations
• Structured reporting and calibration best practices included

Access the full standard:View EN IEC 63616:2026 on iTeh Standards

Industry Impact & Compliance Considerations

The publication of these standards marks a decisive step forward for organizations in metrology, materials science, electrical engineering, and optical technology. For business leaders, quality managers, and engineering teams, the benefits and challenges are multi-faceted:

Impact Overview:

• Enhanced Traceability: Unified procedures ensure all data is internationally comparable
• Product Performance: Improved accuracy in thermal ageing and optical/physical characterization leads to more reliable products
• Compliance and Risk Mitigation: Following updated standards minimizes liability and fosters rapid market access

Compliance Essentials:

• Update laboratory procedures, documentation, and staff training to align with new requirements
• Recalibrate or validate equipment as prescribed (particularly for EN IEC 63616 testing and ellipsometry platforms)
• Plan transition timelines based on the latest standard publication and implementation deadlines (e.g., national adoption periods as specified in EN IEC 63616)

Risks of Non-Compliance:

• Increased measurement uncertainty and data inconsistency
• Delayed or denied certifications and regulatory approvals
• Potential financial and reputational penalties

Strategic Benefits:

• Early adopters gain competitive edge in contract bidding, R&D partnerships, and global trade
• Standardized reporting streamlines supplier–customer relationships

Technical Insights

Despite their varied focus, these standards share several technical touchpoints that metrology professionals must understand:

Common Technical Requirements

• Model Validation: Whether assessing a bulk substrate or thin depositions, model validation (multi-angle ellipsometry, statistical analysis, rigorous equipment calibration) is central
• Documentation: All standards stress comprehensive reporting, from test conditions to uncertainty analysis
• Environmental Control: Consistent temperature, humidity, and contamination controls are vital for validity

Implementation Best Practices

1. Gap Analysis: Review existing practices against new standard requirements
2. Staff Training: Ensure all technical staff are familiar with updated procedures and reporting formats
3. Instrument Upgrades: Check all analytical and measurement devices comply with new statistical and calibration procedures
4. Pilot Studies: Run small-scale validation experiments to confirm reproducibility and compliance
5. Continuous Review: Monitor technical bulletins for amendments or corrigenda post-publication

Testing and Certification

• EN IEC and ISO standards often require or recommend third-party calibration certification
• Participation in interlaboratory comparisons can accelerate recognition of compliance
• Robust uncertainty estimation, as described in the new ellipsometry standards, is increasingly a requirement for certifying authorities

Conclusion & Next Steps

The January 2026 release of these four standards marks a milestone for stakeholders in the metrology and measurement of physical phenomena. Organizations at the forefront of materials innovation, microelectronics, and optical sciences will find that early adoption is essential for regulatory compliance, technical excellence, and business competitiveness.

Key Takeaways:

• Update internal protocols and staff training to match revised procedures
• Leverage the enhanced accuracy and reliability built into the new standards
• Use the direct links above to obtain the official documents for full implementation guidance

For ongoing success, make a habit of monitoring iTeh Standards for announcements and expert analysis on the future of measurement standards. Staying informed, proactive, and compliant is the best strategy to advance quality, innovation, and global reach in metrology and measurement science.